China Electronic Product Reliability and Environmental Test Institute

600 papers and 5.3k indexed citations i.

About

In recent decades, authors affiliated with China Electronic Product Reliability and Environmental Test Institute have published 600 papers, which have received a total of 5.3k indexed citations. Scholars at this organization have produced 346 papers in Electrical and Electronic Engineering, 98 papers in Mechanical Engineering and 90 papers in Materials Chemistry on the topics of Semiconductor materials and devices (82 papers), GaN-based semiconductor devices and materials (64 papers) and Silicon Carbide Semiconductor Technologies (51 papers). Their work is cited by papers focused on Electrical and Electronic Engineering (2.6k citations), Mechanical Engineering (1.1k citations) and Control and Systems Engineering (908 citations). Authors at China Electronic Product Reliability and Environmental Test Institute collaborate with scholars in China, United States and United Kingdom and have published in prestigious journals including Proceedings of the National Academy of Sciences, Advanced Materials and Nature Communications. Some of China Electronic Product Reliability and Environmental Test Institute's most productive authors include Yunfei En, Wenxiao Fang, Yuanhang Wang, Weiheng Shao and Yun Huang.

In The Last Decade

Fields of papers published by authors at China Electronic Product Reliability and Environmental Test Institute

Since Specialization
EngineeringComputer SciencePhysics and AstronomyMathematicsEarth and Planetary SciencesEnergyEnvironmental ScienceMaterials ScienceChemical EngineeringChemistryAgricultural and Biological SciencesVeterinaryDecision SciencesArts and HumanitiesBusiness, Management and AccountingSocial SciencesPsychologyEconomics, Econometrics and FinanceHealth ProfessionsDentistryMedicineBiochemistry, Genetics and Molecular BiologyNeuroscienceNursingImmunology and MicrobiologyPharmacology, Toxicology and Pharmaceutics

This network shows the specialization of papers affiliated with China Electronic Product Reliability and Environmental Test Institute at the time of their publication. Nodes represent fields, and links connect fields that are likely to share authors.

Countries citing scholars working at China Electronic Product Reliability and Environmental Test Institute

Since Specialization
Citations

This map shows the geographic impact of research produced by authors working at China Electronic Product Reliability and Environmental Test Institute. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers produced at China Electronic Product Reliability and Environmental Test Institute with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites China Electronic Product Reliability and Environmental Test Institute more than expected).

Rankless by CCL
2025