China Electronic Product Reliability and Environmental Test Institute

630 papers and 5.7k indexed citations i.

About

In recent decades, authors affiliated with China Electronic Product Reliability and Environmental Test Institute have published 630 papers, which have received a total of 5.7k indexed citations. Scholars at this organization have produced 363 papers in Electrical and Electronic Engineering, 102 papers in Mechanical Engineering and 94 papers in Materials Chemistry on the topics of Semiconductor materials and devices (88 papers), GaN-based semiconductor devices and materials (67 papers) and Silicon Carbide Semiconductor Technologies (52 papers). Their work is cited by papers focused on Electrical and Electronic Engineering (2.7k citations), Mechanical Engineering (1.2k citations) and Control and Systems Engineering (969 citations). Authors at China Electronic Product Reliability and Environmental Test Institute collaborate with scholars in China, United States and United Kingdom and have published in prestigious journals including Proceedings of the National Academy of Sciences, Advanced Materials and Nature Communications. Some of China Electronic Product Reliability and Environmental Test Institute's most productive authors include Yuanhang Wang, Jun Wu, Yunfei En, Xinyu Shao, Yiwei Cheng, Chengcheng Chen, Kui Hu, Haiping Zhu, Wenxiao Fang and Chao Deng.

In The Last Decade

Fields of papers published by authors at China Electronic Product Reliability and Environmental Test Institute

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers affiliated with China Electronic Product Reliability and Environmental Test Institute at the time of their publication. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers affiliated with China Electronic Product Reliability and Environmental Test Institute at the time of their publication.

Countries citing scholars working at China Electronic Product Reliability and Environmental Test Institute

Since Specialization
Citations

This map shows the geographic impact of research produced by authors working at China Electronic Product Reliability and Environmental Test Institute. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers produced at China Electronic Product Reliability and Environmental Test Institute with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites China Electronic Product Reliability and Environmental Test Institute more than expected).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar’s output or impact.

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2025