Beijing Microelectronics Technology Institute
Impact in
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- Advanced Memory and Neural Computing
- Semiconductor materials and devices
- Ferroelectric and Negative Capacitance Devices
- Advancements in Semiconductor Devices and Circuit Design
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- Supercapacitor Materials and Fabrication
Papers in
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- VLSI and Analog Circuit Testing 128
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- Semiconductor materials and devices 268
- Advancements in Semiconductor Devices and Circuit Design 197
- Radiation Effects in Electronics 158
- Integrated Circuits and Semiconductor Failure Analysis 143
- Advanced Memory and Neural Computing 143
- Advancements in PLL and VCO Technologies 88
Beijing Microelectronics Technology Institute
1.8k papers receiving 18.6k citations
Peers
Comparison fields: 5 of 198
- Electrical and Electronic Engineering 11.3k
- Electronic, Optical and Magnetic Materials 1.8k
- Polymers and Plastics 1.4k
- Biomedical Engineering 4.1k
- Hardware and Architecture 603
Countries citing scholars working at Beijing Microelectronics Technology Institute
This map shows the geographic impact of research produced by authors working at Beijing Microelectronics Technology Institute. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers produced at Beijing Microelectronics Technology Institute with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Beijing Microelectronics Technology Institute more than expected).
Fields of papers published by authors at Beijing Microelectronics Technology Institute
This network shows the impact of papers affiliated with Beijing Microelectronics Technology Institute at the time of their publication. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers affiliated with Beijing Microelectronics Technology Institute at the time of their publication.
About Beijing Microelectronics Technology Institute
In recent decades, authors affiliated with Beijing Microelectronics Technology Institute have published 2.2k papers, which have received a total of 19.2k indexed citations . Scholars at this organization have produced 234 papers in Hardware and Architecture, 1.4k papers in Electrical and Electronic Engineering, 223 papers in Computer Networks and Communications, 380 papers in Biomedical Engineering and 167 papers in Computer Vision and Pattern Recognition on the topics of Semiconductor materials and devices (268 papers), Advancements in Semiconductor Devices and Circuit Design (197 papers), Radiation Effects in Electronics (158 papers), Integrated Circuits and Semiconductor Failure Analysis (143 papers), Advanced Memory and Neural Computing (143 papers), Analog and Mixed-Signal Circuit Design (132 papers), VLSI and Analog Circuit Testing (128 papers) and Advancements in PLL and VCO Technologies (88 papers). Their work is cited by papers focused on Electrical and Electronic Engineering (11.3k citations), Electronic, Optical and Magnetic Materials (1.8k citations), Polymers and Plastics (1.4k citations), Biomedical Engineering (4.1k citations) and Hardware and Architecture (603 citations). Authors at Beijing Microelectronics Technology Institute collaborate with scholars in China, Singapore and United States and have published in prestigious journals including Electronics, Journal of Semiconductors, IEEE Access, Sensors and IEEE Transactions on Electron Devices. Some of Beijing Microelectronics Technology Institute's most productive authors include Bin Gao, Ru Huang, Huaqiang Wu, He Qian, Hengchao Sun, Xiaodong Wang, Jianshi Tang, Fuhua Yang, Yang Gao and Yuanfu Zhao.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.