Properties of Silicon Carbide
Impact in
Classified as
- Authors
- Gary HarrisInspec
- Journal
- Medical Entomology and Zoology
In The Last Decade
doi.org/w67959614 →Countries where authors are citing Properties of Silicon Carbide
This map shows the geographic impact of Properties of Silicon Carbide. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Properties of Silicon Carbide with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Properties of Silicon Carbide more than expected).
Fields of papers citing Properties of Silicon Carbide
This network shows the impact of Properties of Silicon Carbide. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the Properties of Silicon Carbide.
About Properties of Silicon Carbide
This paper, published in 1995, received 740 indexed citations . Written by Gary Harris and Inspec covering the research area of Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics. It is primarily cited by scholars working on Electrical and Electronic Engineering (513 citations), Materials Chemistry (300 citations), Ceramics and Composites (155 citations), Atomic and Molecular Physics, and Optics (142 citations) and Mechanical Engineering (94 citations). Published in Medical Entomology and Zoology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.
This paper is also available at doi.org/w67959614.