Young‐Kyu Park
About
Young‐Kyu Park has authored 24 papers that have received a total of 256 indexed citations.
This includes 9 papers in Hardware and Architecture, 8 papers in Electrical and Electronic Engineering and 6 papers in Control and Systems Engineering. The topics of these papers are VLSI and Analog Circuit Testing (9 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Fault Diagnosis in Complex Systems (5 papers). Young‐Kyu Park is often cited by papers focused on VLSI and Analog Circuit Testing (9 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Fault Diagnosis in Complex Systems (5 papers) and collaborates with scholars based in South Korea and United States. Young‐Kyu Park's co-authors include Sangho Lee, Sungho Kang, Yeon Soo Han, Yong‐Su Song and Yongjun Choi and has published in prestigious journals such as Carbon, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Desalination and Water Treatment.
In The Last Decade
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