W.J. Bertram
Impact in
- Bioengineering top 10%
- Analytical Chemistry and Sensors
-
- CCD and CMOS Imaging Sensors
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
Papers in
-
- 3D IC and TSV technologies 5
- CCD and CMOS Imaging Sensors 5
- Semiconductor materials and devices 4
- Electronic Packaging and Soldering Technologies 3
- Advanced Semiconductor Detectors and Materials 2
- Advancements in Semiconductor Devices and Circuit Design 2
-
- GaN-based semiconductor devices and materials 2
- Co-authors
- M.F. Tompsett (5 shared papers)G. F. Amelio (2 shared papers)W. B. Joyce (1 shared paper)Robert Buckley (3 shared papers)Robert Payne (1 shared paper)W.N. Grant (1 shared paper)H. J. Levinstein (2 shared papers)J. C. Mikkelsen (1 shared paper)
- Journals
- IEEE Transactions on Electron Devices (5 papers)Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum (1 paper)Bell System Technical Journal (1 paper)
- Partner nations
- United StatesJapan
In The Last Decade
W.J. Bertram
14 papers receiving 282 citations
Peers
Comparison fields: 5 of 41
- Bioengineering 36
- Electrical and Electronic Engineering 336
- Instrumentation 20
- Hardware and Architecture 19
- Aerospace Engineering 62
Countries citing papers authored by W.J. Bertram
This map shows the geographic impact of W.J. Bertram's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W.J. Bertram with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W.J. Bertram more than expected).
Fields of papers citing papers by W.J. Bertram
This network shows the impact of papers produced by W.J. Bertram. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W.J. Bertram. The network helps show where W.J. Bertram may publish in the future.
Co-authors
The 19 scholars most cited alongside W.J. Bertram, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1971 | 90 | |
| 2 | 1971 | 55 | |
| 3 | 1980 | 50 | |
| 4 | 1971 | 49 | |
| 5 | 1987 | 35 | |
| 6 | 1974 | 28 | |
| 7 | 1973 | 27 | |
| 8 | 1974 | 8 | |
| 9 | 1987 | 8 | |
| 10 | 1964 | 8 | |
| 11 | 1991 | 6 | |
| 12 | 1984 | 6 | |
| 13 | 1969 | 5 | |
| 14 | 2003 | 2 | |
| 15 | 1970 | 1 |
About W.J. Bertram
W.J. Bertram is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials and Instrumentation, having authored 15 papers that have together received 378 indexed citations. Recurring topics across this work include 3D IC and TSV technologies (5 papers), CCD and CMOS Imaging Sensors (5 papers), Semiconductor materials and devices (4 papers), Electronic Packaging and Soldering Technologies (3 papers), GaN-based semiconductor devices and materials (2 papers), Advanced Semiconductor Detectors and Materials (2 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers) and Copper Interconnects and Reliability (2 papers). The work is most often cited by research in Bioengineering (36 citations), Electrical and Electronic Engineering (336 citations), Instrumentation (20 citations), Hardware and Architecture (19 citations) and Aerospace Engineering (62 citations). W.J. Bertram has collaborated with scholars based in United States and Japan. Frequent co-authors include M.F. Tompsett, G. F. Amelio, W. B. Joyce, Robert Buckley, Robert Payne, W.N. Grant, H. J. Levinstein, J. C. Mikkelsen, Carlo H. Séquin and Frank Morris. Their work appears in journals such as IEEE Transactions on Electron Devices, Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum and Bell System Technical Journal.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.