Ulf Smith

878 citations
51 papers · 744 · h-index 12

Impact in

Papers in

    • Semiconductor materials and interfaces 19
    • Force Microscopy Techniques and Applications 6
    • Semiconductor materials and devices 16
    • Thin-Film Transistor Technologies 10
    • Silicon and Solar Cell Technologies 8
    • Silicon Carbide Semiconductor Technologies 5
    • Advancements in Semiconductor Devices and Circuit Design 5

Ulf Smith

48 papers receiving 705 citations

Peers

Ulf Smith
Comparison fields: 5 of 45
  • Atomic and Molecular Physics, and Optics 362
  • Electrical and Electronic Engineering 477
  • Electronic, Optical and Magnetic Materials 151
  • Acoustics and Ultrasonics 7
  • Condensed Matter Physics 82
Replace M. Mihailovic with:
M. Mihailovic France
M. Guziewicz Poland
Hans Norström Sweden
Chenggang Jin China
Peixiong Shi Denmark
Brenda L. VanMil United States
J. Greggi United States
Akihiro Moritani Japan
Rex Watton United Kingdom
Patrizio Verardi Italy
Ulf Smith relative to M. Mihailovic France M. Mihailovic's profile →
Citations per field
00.5×1.5×1.8×
M. Mihailovic · 1×
Citations per year

Countries citing papers authored by Ulf Smith

Since Specialization
Citations

This map shows the geographic impact of Ulf Smith's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ulf Smith with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ulf Smith more than expected).

Fields of papers citing papers by Ulf Smith

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ulf Smith. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ulf Smith. The network helps show where Ulf Smith may publish in the future.

Co-authors

The 25 scholars most cited alongside Ulf Smith, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Ulf Smith Line = papers co-authored together Ulf Smith links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 51 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200078
2 199175
3 200475
4 200267
5 200563
6 199137
7 200432
8 200029
9 199129
10 199124
11 201122
12 201120
13 201412
14 197612
15 199912
16 199111
17 200011
18 19998
19 20017
20 20157

About Ulf Smith

Ulf Smith is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Ceramics and Composites and Mechanics of Materials, having authored 51 papers that have together received 744 indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (19 papers), Semiconductor materials and devices (16 papers), Thin-Film Transistor Technologies (10 papers), Silicon and Solar Cell Technologies (8 papers), Copper Interconnects and Reliability (7 papers), Force Microscopy Techniques and Applications (6 papers), Silicon Carbide Semiconductor Technologies (5 papers) and Advancements in Semiconductor Devices and Circuit Design (5 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (362 citations), Electrical and Electronic Engineering (477 citations), Electronic, Optical and Magnetic Materials (151 citations), Acoustics and Ultrasonics (7 citations) and Condensed Matter Physics (82 citations). Ulf Smith has collaborated with scholars based in Sweden, United States and France. Frequent co-authors include Fredric Ericson, Jan‐Åke Schweitz, Dominique Mangelinck, Tobias Jarmar, S.-L. Zhang, Søren Berg, F. Engelmark, P. Gas, Ilia Katardjiev and C. Bergman. Their work appears in journals such as Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Electrochemical and Solid-State Letters and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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