T.‐M. Lu

75 papers receiving 1.5k citations

Peers

T.‐M. Lu
Comparison fields: 5 of 65
  • Atomic and Molecular Physics, and Optics 646
  • Electronic, Optical and Magnetic Materials 372
  • Surfaces, Coatings and Films 123
  • Materials Chemistry 635
  • Electrical and Electronic Engineering 783
Replace Chung Nam Whang with:
Chung Nam Whang South Korea
W. K. Choi Singapore
Stefan Luby Slovakia
Yasushiro Nishioka Japan
Sadafumi Yoshida Japan
M. G. Grimaldi Italy
Azusa N. Hattori Japan
Mengbing Huang United States
D. Lubben United States
E. Atanassova Bulgaria
T.‐M. Lu relative to Chung Nam Whang South Korea Chung Nam Whang's profile →
Citations per field
00.5×2×3×3.7×
Chung Nam Whang · 1×
Citations per year

Countries citing papers authored by T.‐M. Lu

Since Specialization
Citations

This map shows the geographic impact of T.‐M. Lu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.‐M. Lu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.‐M. Lu more than expected).

Fields of papers citing papers by T.‐M. Lu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T.‐M. Lu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.‐M. Lu. The network helps show where T.‐M. Lu may publish in the future.

Co-authors

The 25 scholars most cited alongside T.‐M. Lu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with T.‐M. Lu Line = papers co-authored together T.‐M. Lu links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 81 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2002368
2 2001164
3 199297
4 198447
5 201545
6 198745
7 200144
8 199433
9 199733
10 200432
11 200730
12 200129
13 199429
14 199129
15 199827
16 198827
17 199526
18 199225
19 199124
20 201722

About T.‐M. Lu

T.‐M. Lu is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Mechanics of Materials and Materials Chemistry, having authored 81 papers that have together received 1.6k indexed citations. Recurring topics across this work include Semiconductor materials and devices (34 papers), Copper Interconnects and Reliability (19 papers), Metal and Thin Film Mechanics (15 papers), nanoparticles nucleation surface interactions (8 papers), Semiconductor materials and interfaces (8 papers), Ion-surface interactions and analysis (8 papers), Surface and Thin Film Phenomena (6 papers) and Advanced Chemical Physics Studies (6 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (646 citations), Electronic, Optical and Magnetic Materials (372 citations), Surfaces, Coatings and Films (123 citations), Materials Chemistry (635 citations) and Electrical and Electronic Engineering (783 citations). T.‐M. Lu has collaborated with scholars based in United States, China and Canada. Frequent co-authors include Yiping Zhao, G.-C. Wang, Pulickel Madhavapanicker Ajayan, X.-C. Zhang, Linda S. Schadler, Nachiket Raravikar, James Alexander Moore, G.‐R. Yang, Joseph M. Pimbley and George Palasantzas. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of The Electrochemical Society and Thin Solid Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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