T. E. F. M. Standaert
About
T. E. F. M. Standaert has authored 15 papers that have received a total of 1.3k indexed citations.
This includes 14 papers in Electrical and Electronic Engineering, 8 papers in Electronic, Optical and Magnetic Materials and 6 papers in Mechanics of Materials. The topics of these papers are Plasma Diagnostics and Applications (11 papers), Semiconductor materials and devices (9 papers) and Copper Interconnects and Reliability (8 papers). T. E. F. M. Standaert is often cited by papers focused on Plasma Diagnostics and Applications (11 papers), Semiconductor materials and devices (9 papers) and Copper Interconnects and Reliability (8 papers) and collaborates with scholars based in United States. T. E. F. M. Standaert's co-authors include G. S. Oehrlein, M. Schaepkens, P. J. Matsuo, N. R. Rueger and T. Dalton and has published in prestigious journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and IBM Journal of Research and Development.
In The Last Decade
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