St. Tosch

559 citations
15 papers · 477 · h-index 12

Impact in

Papers in

St. Tosch

14 papers receiving 451 citations

Peers

St. Tosch
Comparison fields: 5 of 31
  • Surfaces, Coatings and Films 103
  • Structural Biology 20
  • Atomic and Molecular Physics, and Optics 411
  • Biomedical Engineering 131
  • Electrical and Electronic Engineering 130
Replace X. F. Lin with:
X. F. Lin United States
E. S. Hirschorn United States
L. S. O. Johansson Sweden
Jim T. McKinley United States
Scott M. Mokler United Kingdom
G. LeLay France
Pavel Sobotik Czechia
Ivan Ošt’ádal Czechia
J. Viernow United States
Itsuo Katayama Japan
St. Tosch relative to X. F. Lin United States X. F. Lin's profile →
Citations per field
00.5×2×4×6×
X. F. Lin · 1×
Citations per year

Countries citing papers authored by St. Tosch

Since Specialization
Citations

This map shows the geographic impact of St. Tosch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by St. Tosch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites St. Tosch more than expected).

Fields of papers citing papers by St. Tosch

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by St. Tosch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by St. Tosch. The network helps show where St. Tosch may publish in the future.

Co-authors

The 5 scholars most cited alongside St. Tosch, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with St. Tosch Line = papers co-authored together St. Tosch links everyone, so they are left out of the graph.

All Works

15 of 15 papers shown
#Work
1 1988169
2 198757
3 198947
4 198834
5 198833
6 199128
7 198827
8 198919
9 198814
10 198713
11 198613
12 198812
13 19887
14 19884
15 19890

About St. Tosch

St. Tosch is a scholar working on Atomic and Molecular Physics, and Optics, Biomedical Engineering, Structural Biology, Surfaces, Coatings and Films and Radiation, having authored 15 papers that have together received 477 indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (12 papers), Advanced Materials Characterization Techniques (10 papers), Force Microscopy Techniques and Applications (8 papers), Advanced Chemical Physics Studies (2 papers), Semiconductor materials and interfaces (2 papers), Electron and X-Ray Spectroscopy Techniques (2 papers), Advanced Electron Microscopy Techniques and Applications (2 papers) and Microstructure and mechanical properties (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (103 citations), Structural Biology (20 citations), Atomic and Molecular Physics, and Optics (411 citations), Biomedical Engineering (131 citations) and Electrical and Electronic Engineering (130 citations). St. Tosch has collaborated with scholars based in Germany and France. Frequent co-authors include H. Neddermeyer, A. Brodde, Siegmar Diele, DIETRICH DEMUS and Margrit Hanbücken. Their work appears in journals such as Surface Science, Journal of Microscopy, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Physical Review Letters and IBM Journal of Research and Development.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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