S. O’Day

970 citations
6 papers · 11 · h-index 2

Impact in

Papers in

S. O’Day

4 papers receiving 11 citations

Peers

S. O’Day
Comparison fields: 5 of 15
  • Aerospace Engineering 8
  • Software 1
  • Automotive Engineering 3
  • Surfaces, Coatings and Films 1
  • Statistics, Probability and Uncertainty 1
Replace F. Riccardi with:
F. Riccardi Italy
R. Weidenbach United States
R. Valbuena Switzerland
Nicholas M. Jedrich United States
Robert A. Kichak United States
R. Schmidt Switzerland
C. Goy France
B. Martlew United Kingdom
John J. Simmonds United States
L. Ristori United States
S. O’Day relative to F. Riccardi Italy F. Riccardi's profile →
Citations per field
00.5×1.5×
F. Riccardi · 1×
Citations per year

Countries citing papers authored by S. O’Day

Since Specialization
Citations

This map shows the geographic impact of S. O’Day's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. O’Day with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. O’Day more than expected).

Fields of papers citing papers by S. O’Day

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. O’Day. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. O’Day. The network helps show where S. O’Day may publish in the future.

Co-authors

The 9 scholars most cited alongside S. O’Day, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. O’Day Line = papers co-authored together S. O’Day links everyone, so they are left out of the graph.

All Works

6 of 6 papers shown
#Work
1
Metrics for Intelligent Autonomy
20047
2 20022
3 20021
4 19931
5
Charged Hadron Multiplicities in 490 GEV Deep Inelastic Muon Scattering
19900
6 19940

About S. O’Day

S. O’Day is a scholar working on Aerospace Engineering, Electrical and Electronic Engineering, Control and Systems Engineering, Mechanics of Materials and Atomic and Molecular Physics, and Optics, having authored 6 papers that have together received 11 indexed citations. Recurring topics across this work include Particle accelerators and beam dynamics (4 papers), Particle Accelerators and Free-Electron Lasers (3 papers), Quantum Chromodynamics and Particle Interactions (1 paper), Fault Detection and Control Systems (1 paper), Target Tracking and Data Fusion in Sensor Networks (1 paper), Radiation Detection and Scintillator Technologies (1 paper), Gyrotron and Vacuum Electronics Research (1 paper) and Electron and X-Ray Spectroscopy Techniques (1 paper). The work is most often cited by research in Aerospace Engineering (8 citations), Software (1 citation), Automotive Engineering (3 citations), Surfaces, Coatings and Films (1 citation) and Statistics, Probability and Uncertainty (1 citation). S. O’Day has collaborated with scholars based in United States. Frequent co-authors include F.M. Bieniosek, M. Church, K. Anderson, Marc Steinberg, Matthew Curry, H. Park, M. Gormley, C. Kim and A. Bross. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, Proceedings of the 1997 Particle Accelerator Conference (Cat. No.97CH36167) and PhDT.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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