S. Krishnan

4.3k citations
133 papers · 3.2k · 1 hit paper · h-index 25

Impact in

  • Electrical and Electronic Engineering top 1%
    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Ferroelectric and Negative Capacitance Devices
    • Radio Frequency Integrated Circuit Design
    • Silicon Carbide Semiconductor Technologies
  • Hardware and Architecture top 2%

Papers in

  • Electrical and Electronic Engineering 125
    • Semiconductor materials and devices 85
    • Advancements in Semiconductor Devices and Circuit Design 66
    • Integrated Circuits and Semiconductor Failure Analysis 40
    • Radio Frequency Integrated Circuit Design 24
    • Semiconductor Lasers and Optical Devices 13
    • Silicon Carbide Semiconductor Technologies 12
  • Atomic and Molecular Physics, and Optics 18
    • Semiconductor Quantum Structures and Devices 13
Co-authors
A.T. Krishnan (22 shared papers)V. Reddy (16 shared papers)Prakash Desayi (1 shared paper)S. Chakravarthi (5 shared papers)Yu Cao (8 shared papers)J. P. Campbell (12 shared papers)Patrick M. Lenahan (11 shared papers)Vijay Reddy (16 shared papers)
Journals
IEEE Transactions on Electron Devices (9 papers)Applied Physics Letters (8 papers)Electronics Letters (5 papers)IEEE Transactions on Device and Materials Reliability (5 papers)Microelectronics Reliability (4 papers)
Partner nations
United StatesUnited KingdomItaly

In The Last Decade

S. Krishnan

126 papers receiving 3.0k citations

S. Krishnan's Hit Papers

Equation for the Stress-Strain Curve of Concrete 1964 · 382 citations
3820+20+41Years since publication100200300
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if any of the following hold:

  • it has ≥500 total citations;
  • it reaches ≥1.5× the top-1% citation threshold for papers in the same subfield and year (the threshold is the minimum needed to enter the top 1%, not the average within it);
  • it reaches the top citation threshold in at least one of its specific research topics.
  1. 1964 ACI Journal Proceedings

Peers

S. Krishnan
Comparison fields: 5 of 64
  • Electrical and Electronic Engineering 2.7k
  • Hardware and Architecture 252
  • Building and Construction 312
  • Civil and Structural Engineering 373
  • Condensed Matter Physics 129
Replace Yunqiu Wu with:
Yunqiu Wu China
Ying Wang China
Kjell Jeppson Sweden
M. Rencz Hungary
J.C.H. Phang Singapore
Gábor Farkas Hungary
Hongliang Chang China
S.C. O’Mathuna Ireland
Long Yang United States
Yan Gao China
S. Krishnan relative to Yunqiu Wu China Yunqiu Wu's profile →
Citations per field
00.5×5×10×15×18×
Yunqiu Wu · 1×
Citations per year

Countries citing papers authored by S. Krishnan

Since Specialization
Citations

This map shows the geographic impact of S. Krishnan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Krishnan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Krishnan more than expected).

Fields of papers citing papers by S. Krishnan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Krishnan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Krishnan. The network helps show where S. Krishnan may publish in the future.

Co-authors

The 25 scholars most cited alongside S. Krishnan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Krishnan Line = papers co-authored together S. Krishnan links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 133 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Equation for the Stress-Strain Curve of Concrete
ACI Journal Proceedings ·Prakash Desayi, S. Krishnan
Hit paper breakdown →		1964382
2
Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology
IEEE Transactions on Device and Materials Reliability ·Wenping Wang, V. Reddy, A.T. Krishnan, Rakesh Vattikonda, S. Krishnan, Yu Cao
2007259
3
A comprehensive framework for predictive modeling of negative bias temperature instability
S. Chakravarthi, A.T. Krishnan, V. Reddy, C. Machala, S. Krishnan
2004256
4
Impact of negative bias temperature instability on digital circuit reliability
V. Reddy, A.T. Krishnan, Andrew Marshall, J. Antonio Travieso-Rodríguez, S. Natarajan, T.A. Rost, S. Krishnan
2003194
5
NBTI impact on transistor and circuit: models, mechanisms and scaling effects [MOSFETs]
A.T. Krishnan, V. Reddy, S. Chakravarthi, J. Antonio Travieso-Rodríguez, Samuel John, S. Krishnan
2004169
6
Material dependence of hydrogen diffusion: implications for NBTI degradation
A.T. Krishnan, C. Chancellor, S. Chakravarthi, Paul E. Nicollian, V. Reddy, A. Varghese, R. Khamankar, S. Krishnan
2006147
7
Submicron scaling of HBTs
IEEE Transactions on Electron Devices ·M.J.W. Rodwell, Miguel Urteaga, T. Mathew, D. Scott, D. Mensa, Q. Lee, James Guthrie, Y. Betser, Suzanne Martin, R.P. Smith, S. Jaganathan, S. Krishnan, S.I. Long, R. Pullela, B. Agarwal, Uma Bhattacharya, Lorene Samoska, M. Dahlstrǒm
2001126
8
Impact of negative bias temperature instability on digital circuit reliability
Microelectronics Reliability ·Vijay Reddy, Anand Krishnan, Andrew Marshall, John Rodriguez, S. Natarajan, Tim Rost, S. Krishnan
2004100
9
Atomic-scale defects involved in the negative-bias temperature instability
IEEE Transactions on Device and Materials Reliability ·J. P. Campbell, Patrick M. Lenahan, Corey J. Cochrane, Anand Krishnan, S. Krishnan
200783
10
Negative bias temperature instability mechanism: The role of molecular hydrogen
Applied Physics Letters ·Anand Krishnan, S. Chakravarthi, Paul E. Nicollian, Vijay Reddy, S. Krishnan
200672
11
Statistical prediction of circuit aging under process variations
Wenping Wang, Vijay Reddy, Bo Yang, Varsha Balakrishnan, S. Krishnan, Yu Cao
200865
12
off-State Degradation in Drain-Extended NMOS Transistors: Interface Damage and Correlation to Dielectric Breakdown
IEEE Transactions on Electron Devices ·Dhanoop Varghese, Haldun Küflüoğlu, V. Reddy, H. Shichijo, D. Mosher, S. Krishnan, Md Ashraful Alam
200760
13
Circuit aging prediction for low-power operation
Rui Zheng, Jyothi Velamala, Vijay Reddy, Varsha Balakrishnan, Evelyn Mintarno, Subhasish Mitra, S. Krishnan, Yu Cao
200948
14
Observations of NBTI-Induced Atomic-Scale Defects
IEEE Transactions on Device and Materials Reliability ·J. P. Campbell, Patrick M. Lenahan, A.T. Krishnan, S. Krishnan
200646
15
NBTI: An Atomic-Scale Defect Perspective
J. P. Campbell, Patrick M. Lenahan, A.T. Krishnan, S. Krishnan
200646
16
Current collapse in GaN heterojunction field effect transistors for high-voltage switching applications
Jungwoo Joh, N. Tipirneni, S. Pendharkar, S. Krishnan
201441
17
Impact of charging damage on negative bias temperature instability
A.T. Krishnan, V. Reddy, S. Krishnan
200239
18
Direct observation of the structure of defect centers involved in the negative bias temperature instability
Applied Physics Letters ·J. P. Campbell, Patrick M. Lenahan, A.T. Krishnan, S. Krishnan
200538
19
Grasping SOI floating-body effects
IEEE Circuits and Devices Magazine ·S. Krishnan, J.G. Fossum
199833
20
Wideband DHBTs using a graded carbon-doped InGaAs base
IEEE Electron Device Letters ·M. Dahlstrǒm, X. M. Fang, D. Lubyshev, Miguel Urteaga, S. Krishnan, N. Parthasarathy, Y.M. Kim, Yuh‐Renn Wu, J. M. Fastenau, W.K. Liu, M.J.W. Rodwell
200331

About S. Krishnan

S. Krishnan is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Biomedical Engineering and Materials Chemistry, having authored 133 papers that have together received 3.2k indexed citations. Recurring topics across this work include Semiconductor materials and devices (85 papers), Advancements in Semiconductor Devices and Circuit Design (66 papers), Integrated Circuits and Semiconductor Failure Analysis (40 papers), Radio Frequency Integrated Circuit Design (24 papers), Semiconductor Quantum Structures and Devices (13 papers), Semiconductor Lasers and Optical Devices (13 papers), Copper Interconnects and Reliability (12 papers) and Silicon Carbide Semiconductor Technologies (12 papers). The work is most often cited by research in Electrical and Electronic Engineering (2.7k citations), Hardware and Architecture (252 citations), Building and Construction (312 citations), Civil and Structural Engineering (373 citations) and Condensed Matter Physics (129 citations). S. Krishnan has collaborated with scholars based in United States, United Kingdom and Italy. Frequent co-authors include A.T. Krishnan, V. Reddy, Prakash Desayi, S. Chakravarthi, Yu Cao, J. P. Campbell, Patrick M. Lenahan, Vijay Reddy, Wenping Wang and Anand Krishnan. Their work appears in journals such as IEEE Transactions on Electron Devices, Applied Physics Letters, Electronics Letters, IEEE Transactions on Device and Materials Reliability and Microelectronics Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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