S. K. Dew

122 papers receiving 2.1k citations

Peers

S. K. Dew
Comparison fields: 5 of 88
  • Surfaces, Coatings and Films 443
  • Mechanics of Materials 777
  • Computational Mechanics 545
  • Electronic, Optical and Magnetic Materials 426
  • Electrical and Electronic Engineering 1.2k
Replace M. Rothschild with:
M. Rothschild United States
T. Smy Canada
Yiao-Tee Hsia United States
William A. Challener United States
J.P. McVittie United States
Edward C. Gage United States
Harley T. Johnson United States
Chubing Peng United States
E. van der Drift Netherlands
R. Rottmayer United States
S. K. Dew relative to M. Rothschild United States M. Rothschild's profile →
Citations per field
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Citations per year

Countries citing papers authored by S. K. Dew

Since Specialization
Citations

This map shows the geographic impact of S. K. Dew's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. K. Dew with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. K. Dew more than expected).

Fields of papers citing papers by S. K. Dew

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. K. Dew. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. K. Dew. The network helps show where S. K. Dew may publish in the future.

Co-authors

The 25 scholars most cited alongside S. K. Dew, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. K. Dew Line = papers co-authored together S. K. Dew links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 125 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1995202
2 1999152
3 200075
4 200167
5 201157
6 201254
7 200254
8 200348
9 200642
10 200340
11 199240
12 201139
13 200437
14 199436
15 200933
16 198933
17 201032
18 200232
19 199330
20 199228

About S. K. Dew

S. K. Dew is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Electronic, Optical and Magnetic Materials, Computational Mechanics and Biomedical Engineering, having authored 125 papers that have together received 2.2k indexed citations. Recurring topics across this work include Metal and Thin Film Mechanics (49 papers), Copper Interconnects and Reliability (31 papers), Ion-surface interactions and analysis (26 papers), Semiconductor materials and devices (21 papers), Advancements in Photolithography Techniques (18 papers), Plasma Diagnostics and Applications (13 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Advanced Surface Polishing Techniques (8 papers). The work is most often cited by research in Surfaces, Coatings and Films (443 citations), Mechanics of Materials (777 citations), Computational Mechanics (545 citations), Electronic, Optical and Magnetic Materials (426 citations) and Electrical and Electronic Engineering (1.2k citations). S. K. Dew has collaborated with scholars based in Canada, United States and Russia. Frequent co-authors include Maria Stepanova, T. Smy, Michael J. Brett, L. J. Friedrich, Kevin Robbie, Mohammad Mohammad, D. Vick, David Field, R. Niall Tait and F. Jiménez. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of Applied Physics, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Thin Solid Films and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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