Philip Bleys

1.5k citations
25 papers · 1.2k · h-index 14

Impact in

    • Advanced machining processes and optimization
    • Advanced Measurement and Metrology Techniques
    • Advanced Surface Polishing Techniques
    • Advanced X-ray and CT Imaging

Papers in

Philip Bleys

25 papers receiving 1.1k citations

Peers

Philip Bleys
Comparison fields: 5 of 95
  • Mechanical Engineering 807
  • Biomedical Engineering 612
  • Geology 63
  • Electrical and Electronic Engineering 616
  • Industrial and Manufacturing Engineering 103
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Citations per year

Countries citing papers authored by Philip Bleys

Since Specialization
Citations

This map shows the geographic impact of Philip Bleys's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Philip Bleys with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Philip Bleys more than expected).

Fields of papers citing papers by Philip Bleys

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Philip Bleys. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Philip Bleys. The network helps show where Philip Bleys may publish in the future.

Co-authors

The 25 scholars most cited alongside Philip Bleys, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Philip Bleys Line = papers co-authored together Philip Bleys links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 25 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2004215
2
A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology
2011207
3 2008127
4 2002110
5 200489
6 200681
7 201270
8 201153
9
Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies
200951
10 200945
11 200029
12
Surface and sub-surface quality in material removal processes for tool making
199819
13
Wire rupture prevention using on-line pulse localisation in WEDM
199816
14 201214
15
International Symposium on Electromachining
200413
16
A test object for calibration and accuracy assessment in X-ray CT metrology
20109
17
Electrical discharge milling: technology and tool wear compensation
20038
18
Machining curvilinear surfaces by NC electro discharge machining
20007
19
Uncertainty due to limited sampling of circular features on coordinate measuring machines
20076
20
Milling EDM of 3D shapes with tubular electrodes
20015

About Philip Bleys

Philip Bleys is a scholar working on Mechanical Engineering, Electrical and Electronic Engineering, Biomedical Engineering, Industrial and Manufacturing Engineering and Computational Mechanics, having authored 25 papers that have together received 1.2k indexed citations. Recurring topics across this work include Advanced Machining and Optimization Techniques (12 papers), Advanced Surface Polishing Techniques (10 papers), Advanced machining processes and optimization (8 papers), Advanced Measurement and Metrology Techniques (8 papers), Surface Roughness and Optical Measurements (3 papers), Advanced X-ray and CT Imaging (3 papers), Manufacturing Process and Optimization (3 papers) and Engineering Technology and Methodologies (3 papers). The work is most often cited by research in Mechanical Engineering (807 citations), Biomedical Engineering (612 citations), Geology (63 citations), Electrical and Electronic Engineering (616 citations) and Industrial and Manufacturing Engineering (103 citations). Philip Bleys has collaborated with scholars based in Belgium, Serbia and Netherlands. Frequent co-authors include Jean‐Pierre Kruth, Nick Van Gestel, Frank Welkenhuyzen, Benny Schacht, J.-P. Kruth, Wim Dewulf, Kim Kiekens, André Voet, Wenru Liu and Ye Tan. Their work appears in journals such as Journal of Materials Processing Technology, CIRP Annals, Optics and Lasers in Engineering, Measurement and Microwave and Optical Technology Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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