Peter Hartel
Impact in
- Structural Biology top 0.1%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 0.5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 36
-
- Advanced Electron Microscopy Techniques and Applications 31
- Co-authors
- H. Rose (8 shared papers)Heiko Müller (24 shared papers)Stephan Uhlemann (21 shared papers)M. Haider (10 shared papers)Maximilian Haider (10 shared papers)J. Żach (7 shared papers)G. Benner (8 shared papers)Joachim Zach (5 shared papers)
- Journals
- Microscopy and Microanalysis (24 papers)Ultramicroscopy (8 papers)Physical Review Letters (3 papers)Surface Review and Letters (2 papers)Journal of Electron Spectroscopy and Related Phenomena (1 paper)
- Partner nations
- GermanyUnited StatesUnited Kingdom
In The Last Decade
Peter Hartel
42 papers receiving 1.5k citations
Peers
Comparison fields: 5 of 60
- Structural Biology 855
- Surfaces, Coatings and Films 765
- Radiation 250
- Materials Chemistry 571
- Atomic and Molecular Physics, and Optics 381
Countries citing papers authored by Peter Hartel
This map shows the geographic impact of Peter Hartel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Hartel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Hartel more than expected).
Fields of papers citing papers by Peter Hartel
This network shows the impact of papers produced by Peter Hartel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Hartel. The network helps show where Peter Hartel may publish in the future.
Co-authors
The 25 scholars most cited alongside Peter Hartel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 46 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1996 | 321 | |
| 2 | 2011 | 156 | |
| 3 | 1997 | 102 | |
| 4 | 2016 | 97 | |
| 5 | 2010 | 90 | |
| 6 | 2009 | 86 | |
| 7 | 2006 | 79 | |
| 8 | 2013 | 73 | |
| 9 | 2002 | 72 | |
| 10 | 2010 | 66 | |
| 11 | 2010 | 64 | |
| 12 | 1998 | 62 | |
| 13 | 2011 | 60 | |
| 14 | 2009 | 49 | |
| 15 | 2011 | 24 | |
| 16 | 2010 | 22 | |
| 17 | 2012 | 22 | |
| 18 | 2007 | 21 | |
| 19 | 2009 | 13 | |
| 20 | 2006 | 10 |
About Peter Hartel
Peter Hartel is a scholar working on Surfaces, Coatings and Films, Structural Biology, Radiation, Electrical and Electronic Engineering and Biomedical Engineering, having authored 46 papers that have together received 1.6k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (36 papers), Advanced Electron Microscopy Techniques and Applications (31 papers), Advanced X-ray Imaging Techniques (13 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Advanced Materials Characterization Techniques (6 papers), Advancements in Photolithography Techniques (5 papers), X-ray Spectroscopy and Fluorescence Analysis (4 papers) and Graphene research and applications (3 papers). The work is most often cited by research in Structural Biology (855 citations), Surfaces, Coatings and Films (765 citations), Radiation (250 citations), Materials Chemistry (571 citations) and Atomic and Molecular Physics, and Optics (381 citations). Peter Hartel has collaborated with scholars based in Germany, United States and United Kingdom. Frequent co-authors include H. Rose, Heiko Müller, Stephan Uhlemann, M. Haider, Maximilian Haider, J. Żach, G. Benner, Joachim Zach, Ute Kaiser and Johannes Biskupek. Their work appears in journals such as Microscopy and Microanalysis, Ultramicroscopy, Physical Review Letters, Surface Review and Letters and Journal of Electron Spectroscopy and Related Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.