Patrick J. Reardon

42 papers receiving 166 citations

Peers

Patrick J. Reardon
Comparison fields: 5 of 41
  • Instrumentation 14
  • Computer Vision and Pattern Recognition 65
  • Atomic and Molecular Physics, and Optics 64
  • Surfaces, Coatings and Films 12
  • Astronomy and Astrophysics 26
Replace Ian Tosh with:
Ian Tosh United Kingdom
Mathieu Cohen France
Michael J. Kidger United Kingdom
Ron Eng United States
Joseph M. Geary United States
Layton C. Hale United States
Ciro Del Vecchio Italy
Justin D. Mansell United States
R. Smythe United States
Carolyn Atkins United Kingdom
Patrick J. Reardon relative to Ian Tosh United Kingdom Ian Tosh's profile →
Citations per field
00.5×
Ian Tosh · 1×
Citations per year

Countries citing papers authored by Patrick J. Reardon

Since Specialization
Citations

This map shows the geographic impact of Patrick J. Reardon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick J. Reardon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick J. Reardon more than expected).

Fields of papers citing papers by Patrick J. Reardon

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick J. Reardon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick J. Reardon. The network helps show where Patrick J. Reardon may publish in the future.

Co-authors

The 25 scholars most cited alongside Patrick J. Reardon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Patrick J. Reardon Line = papers co-authored together Patrick J. Reardon links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 48 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201018
2 201312
3 200411
4 20079
5 20139
6 20119
7 20108
8 19897
9 20057
10 20006
11 20096
12 19896
13 19776
14 20056
15 20065
16 20145
17 20204
18 20014
19 20063
20 19753

About Patrick J. Reardon

Patrick J. Reardon is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Biomedical Engineering, Computer Vision and Pattern Recognition and Aerospace Engineering, having authored 48 papers that have together received 177 indexed citations. Recurring topics across this work include Optical measurement and interference techniques (11 papers), Advanced Measurement and Metrology Techniques (11 papers), Adaptive optics and wavefront sensing (9 papers), Superconducting Materials and Applications (7 papers), Optical Coatings and Gratings (7 papers), Photonic and Optical Devices (6 papers), Advanced optical system design (6 papers) and Advanced Fiber Optic Sensors (4 papers). The work is most often cited by research in Instrumentation (14 citations), Computer Vision and Pattern Recognition (65 citations), Atomic and Molecular Physics, and Optics (64 citations), Surfaces, Coatings and Films (12 citations) and Astronomy and Astrophysics (26 citations). Patrick J. Reardon has collaborated with scholars based in United States. Frequent co-authors include Russell A. Chipman, R. L. Fork, Ayshah S. Alatawi, Joseph M. Geary, Ron Eng, Martin S. Heimbeck, Robert Brown, David Lamb, Henry O. Everitt and Fei Liu. Their work appears in journals such as Optics Letters, Optics Express, Optical Engineering, Applied Optics and IEEE Transactions on Nuclear Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact