Patrick Emmel

29 papers receiving 210 citations

Peers

Patrick Emmel
Comparison fields: 5 of 43
  • Computer Graphics and Computer-Aided Design 61
  • Atomic and Molecular Physics, and Optics 216
  • Industrial and Manufacturing Engineering 61
  • Computer Vision and Pattern Recognition 102
  • Acoustics and Ultrasonics 3
Replace David R. Wyble with:
David R. Wyble United States
Peter Morovič United Kingdom
Lawrence A. Taplin United States
Po‐Chieh Hung United States
J. A. C. Yule United States
Jeffrey M. DiCarlo United States
Mitchell R. Rosen United States
Moon-Hyun Lee South Korea
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Citations per field
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Citations per year

Countries citing papers authored by Patrick Emmel

Since Specialization
Citations

This map shows the geographic impact of Patrick Emmel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick Emmel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick Emmel more than expected).

Fields of papers citing papers by Patrick Emmel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick Emmel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick Emmel. The network helps show where Patrick Emmel may publish in the future.

Co-authors

The 7 scholars most cited alongside Patrick Emmel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Patrick Emmel Line = papers co-authored together Patrick Emmel links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 31 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200540
2 200034
3 200222
4 199820
5 199917
6 200317
7 200315
8 199812
9 20029
10 20019
11 20027
12
A "one channel" spectral colour prediction model for transparent fluorescent inks on a transparent support
19976
13 19966
14 20036
15 19996
16 20025
17 19945
18
Anti-counterfeiting features of artistic screening
19964
19 20004
20 19964

About Patrick Emmel

Patrick Emmel is a scholar working on Atomic and Molecular Physics, and Optics, Computer Vision and Pattern Recognition, Social Psychology, Computer Graphics and Computer-Aided Design and Computational Mechanics, having authored 31 papers that have together received 274 indexed citations. Recurring topics across this work include Color Science and Applications (31 papers), Image Enhancement Techniques (9 papers), Color perception and design (6 papers), Computer Graphics and Visualization Techniques (6 papers), Surface Roughness and Optical Measurements (5 papers), Industrial Vision Systems and Defect Detection (4 papers), Cultural Heritage Materials Analysis (3 papers) and Dye analysis and toxicity (2 papers). The work is most often cited by research in Computer Graphics and Computer-Aided Design (61 citations), Atomic and Molecular Physics, and Optics (216 citations), Industrial and Manufacturing Engineering (61 citations), Computer Vision and Pattern Recognition (102 citations) and Acoustics and Ultrasonics (3 citations). Patrick Emmel has collaborated with scholars based in Switzerland, Canada and Austria. Frequent co-authors include Roger D. Hersch, Victor Ostromoukhov, Safer Mourad, Isaac Amidror, Klaus Simon, Mathieu Hébert and Cécile Péraire. Their work appears in journals such as Journal of Imaging Science and Technology, Journal of the Optical Society of America A, ACM Transactions on Graphics, IEEE Computer Graphics and Applications and Applied Optics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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