Patrick Emmel

31 papers receiving 236 citations

Peers

Patrick Emmel
Comparison fields: 5 of 47
  • Computer Graphics and Computer-Aided Design 64
  • Atomic and Molecular Physics, and Optics 241
  • Industrial and Manufacturing Engineering 61
  • Computer Vision and Pattern Recognition 121
  • Acoustics and Ultrasonics 3
Replace David R. Wyble with:
David R. Wyble United States
Henry R. Kang United States
Peter Morovič United Kingdom
Di-Yuan Tzeng United States
Peter G. Engeldrum United States
Lawrence A. Taplin United States
Ján Morovič United Kingdom
Mitchell R. Rosen United States
Po‐Chieh Hung United States
J. A. C. Yule United States
Patrick Emmel relative to David R. Wyble United States David R. Wyble's profile →
Citations per field
00.5×1.5×2.4×
David R. Wyble · 1×
Citations per year

Countries citing papers authored by Patrick Emmel

Since Specialization
Citations

This map shows the geographic impact of Patrick Emmel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick Emmel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick Emmel more than expected).

Fields of papers citing papers by Patrick Emmel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick Emmel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick Emmel. The network helps show where Patrick Emmel may publish in the future.

Co-authors

The 7 scholars most cited alongside Patrick Emmel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Patrick Emmel Line = papers co-authored together Patrick Emmel links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 33 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200540
2 200038
3 199831
4 200224
5 199919
6 200319
7 200316
8 199813
9 200210
10 200110
11 19998
12
A "one channel" spectral colour prediction model for transparent fluorescent inks on a transparent support
19977
13 20027
14 20037
15 19966
16 19946
17 20025
18 19965
19
Anti-counterfeiting features of artistic screening
19964
20 20004

About Patrick Emmel

Patrick Emmel is a scholar working on Atomic and Molecular Physics, and Optics, Computer Vision and Pattern Recognition, Social Psychology, Computer Graphics and Computer-Aided Design and Computational Mechanics, having authored 33 papers that have together received 311 indexed citations. Recurring topics across this work include Color Science and Applications (33 papers), Image Enhancement Techniques (11 papers), Color perception and design (8 papers), Computer Graphics and Visualization Techniques (6 papers), Surface Roughness and Optical Measurements (5 papers), Industrial Vision Systems and Defect Detection (4 papers), Cultural Heritage Materials Analysis (3 papers) and Dye analysis and toxicity (2 papers). The work is most often cited by research in Computer Graphics and Computer-Aided Design (64 citations), Atomic and Molecular Physics, and Optics (241 citations), Industrial and Manufacturing Engineering (61 citations), Computer Vision and Pattern Recognition (121 citations) and Acoustics and Ultrasonics (3 citations). Patrick Emmel has collaborated with scholars based in Switzerland, Canada and Austria. Frequent co-authors include Roger D. Hersch, Victor Ostromoukhov, Isaac Amidror, Safer Mourad, Klaus Simon, Mathieu Hébert and Cécile Péraire. Their work appears in journals such as Journal of the Optical Society of America A, Journal of Imaging Science and Technology, IEEE Computer Graphics and Applications, Applied Optics and ACM Transactions on Graphics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact