N. Li

8 papers receiving 376 citations

Peers

N. Li
Comparison fields: 5 of 52
  • Structural Biology 15
  • Computer Vision and Pattern Recognition 183
  • Surfaces, Coatings and Films 35
  • Media Technology 41
  • Metals and Alloys 11
Replace Nicolas Cornille with:
Nicolas Cornille France
Adam D. Kammers United States
Fulong Dai China
W.C. Lenthe United States
Tijmen Vermeij Netherlands
Toby Francis United States
Reinhold Ritter Germany
Sören Zimmermann Germany
Karl-Heinz Leitz Germany
N. Li relative to Nicolas Cornille France Nicolas Cornille's profile →
Citations per field
00.5×1.5×1.8×
Nicolas Cornille · 1×
Citations per year

Countries citing papers authored by N. Li

Since Specialization
Citations

This map shows the geographic impact of N. Li's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Li with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Li more than expected).

Fields of papers citing papers by N. Li

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. Li. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Li. The network helps show where N. Li may publish in the future.

Co-authors

The 12 scholars most cited alongside N. Li, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with N. Li Line = papers co-authored together N. Li links everyone, so they are left out of the graph.

All Works

9 of 9 papers shown
#Work
1 2007243
2 200757
3 200839
4 201620
5 200518
6 20013
7 20053
8 20163
9 20250

About N. Li

N. Li is a scholar working on Computer Vision and Pattern Recognition, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Geology and Computational Mechanics, having authored 9 papers that have together received 386 indexed citations. Recurring topics across this work include Optical measurement and interference techniques (8 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Force Microscopy Techniques and Applications (4 papers), 3D Surveying and Cultural Heritage (3 papers), Advanced Measurement and Metrology Techniques (2 papers), Advanced Electron Microscopy Techniques and Applications (1 paper), Surface Roughness and Optical Measurements (1 paper) and Industrial Vision Systems and Defect Detection (1 paper). The work is most often cited by research in Structural Biology (15 citations), Computer Vision and Pattern Recognition (183 citations), Surfaces, Coatings and Films (35 citations), Media Technology (41 citations) and Metals and Alloys (11 citations). N. Li has collaborated with scholars based in United States, China and Japan. Frequent co-authors include Michael A. Sutton, Xiao Li, David C. Joy, A. P. Reynolds, M. A. Sutton, Hubert W. Schreier, Xiaodong Li, S.R. McNeill, Sreehari Rajan and Y.J. Chao. Their work appears in journals such as Experimental Mechanics, The Journal of Strain Analysis for Engineering Design and Biomedical Signal Processing and Control.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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