N. Cherief
Impact in
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- Semiconductor materials and interfaces
- Surface and Thin Film Phenomena
- Magnetic properties of thin films
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- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
- Semiconductor materials and devices
Papers in
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- Semiconductor materials and interfaces 7
- Surface and Thin Film Phenomena 6
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- Advanced Materials Characterization Techniques 6
- Co-authors
- R.C. Cinti (5 shared papers)T.A. Nguyen Tan (4 shared papers)J. Derrien (5 shared papers)C. d’Anterroches (1 shared paper)Pierre Muret (2 shared papers)D. Givord (5 shared papers)J.‐Y. Veuillen (3 shared papers)F. Robaut (4 shared papers)
- Journals
- Surface Science (2 papers)Journal of Applied Physics (2 papers)Journal of Magnetism and Magnetic Materials (2 papers)Microelectronic Engineering (1 paper)Applied Physics Letters (1 paper)
- Partner nations
- FranceIrelandUnited Kingdom
In The Last Decade
N. Cherief
12 papers receiving 447 citations
Peers
Comparison fields: 5 of 32
- Atomic and Molecular Physics, and Optics 409
- Electrical and Electronic Engineering 273
- Electronic, Optical and Magnetic Materials 44
- Biomedical Engineering 87
- Materials Chemistry 76
Countries citing papers authored by N. Cherief
This map shows the geographic impact of N. Cherief's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Cherief with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Cherief more than expected).
Fields of papers citing papers by N. Cherief
This network shows the impact of papers produced by N. Cherief. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Cherief. The network helps show where N. Cherief may publish in the future.
Co-authors
The 23 scholars most cited alongside N. Cherief, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1989 | 163 | |
| 2 | 1991 | 120 | |
| 3 | 1990 | 46 | |
| 4 | 1989 | 35 | |
| 5 | 1993 | 28 | |
| 6 | 1993 | 21 | |
| 7 | 1995 | 15 | |
| 8 | 1994 | 13 | |
| 9 | 1990 | 9 | |
| 10 | 1991 | 9 | |
| 11 | 1994 | 9 | |
| 12 | 1992 | 1 |
About N. Cherief
N. Cherief is a scholar working on Atomic and Molecular Physics, and Optics, Biomedical Engineering, Mechanics of Materials, Materials Chemistry and Condensed Matter Physics, having authored 12 papers that have together received 469 indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (7 papers), Surface and Thin Film Phenomena (6 papers), Advanced Materials Characterization Techniques (6 papers), Metal and Thin Film Mechanics (3 papers), Diamond and Carbon-based Materials Research (2 papers), Rare-earth and actinide compounds (2 papers), Laser-induced spectroscopy and plasma (1 paper) and Silicon and Solar Cell Technologies (1 paper). The work is most often cited by research in Atomic and Molecular Physics, and Optics (409 citations), Electrical and Electronic Engineering (273 citations), Electronic, Optical and Magnetic Materials (44 citations), Biomedical Engineering (87 citations) and Materials Chemistry (76 citations). N. Cherief has collaborated with scholars based in France, Ireland and United Kingdom. Frequent co-authors include R.C. Cinti, T.A. Nguyen Tan, J. Derrien, C. d’Anterroches, Pierre Muret, D. Givord, J.‐Y. Veuillen, F. Robaut, S. Kennou and M. De Crescenzi. Their work appears in journals such as Surface Science, Journal of Applied Physics, Journal of Magnetism and Magnetic Materials, Microelectronic Engineering and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.