M.T. Bishop

41 papers receiving 451 citations

Peers

M.T. Bishop
Comparison fields: 5 of 72
  • Electronic, Optical and Magnetic Materials 133
  • Control and Systems Engineering 165
  • Electrical and Electronic Engineering 361
  • Safety, Risk, Reliability and Quality 38
  • Cognitive Neuroscience 61
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Longfei Zhang China
Tae‐Hwan Kim South Korea
Xiaojuan Chen China
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Countries citing papers authored by M.T. Bishop

Since Specialization
Citations

This map shows the geographic impact of M.T. Bishop's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.T. Bishop with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.T. Bishop more than expected).

Fields of papers citing papers by M.T. Bishop

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M.T. Bishop. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.T. Bishop. The network helps show where M.T. Bishop may publish in the future.

Co-authors

The 16 scholars most cited alongside M.T. Bishop, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M.T. Bishop Line = papers co-authored together M.T. Bishop links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 48 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Views into the Chinese Room: New Essays on Searle and Artificial Intelligence
200260
2 199658
3 199656
4 200250
5 199645
6 199529
7 200921
8 200220
9 199415
10 198615
11 200212
12 199212
13 200211
14 199310
15 20029
16 20149
17 19928
18 20178
19 19967
20 19857

About M.T. Bishop

M.T. Bishop is a scholar working on Electrical and Electronic Engineering, Control and Systems Engineering, Safety, Risk, Reliability and Quality, Computational Theory and Mathematics and Experimental and Cognitive Psychology, having authored 48 papers that have together received 523 indexed citations. Recurring topics across this work include Power Quality and Harmonics (14 papers), Power Transformer Diagnostics and Insulation (11 papers), Power System Reliability and Maintenance (11 papers), Electrical Fault Detection and Protection (8 papers), Power Systems Fault Detection (8 papers), Non-Destructive Testing Techniques (6 papers), High voltage insulation and dielectric phenomena (5 papers) and Computability, Logic, AI Algorithms (5 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (133 citations), Control and Systems Engineering (165 citations), Electrical and Electronic Engineering (361 citations), Safety, Risk, Reliability and Quality (38 citations) and Cognitive Neuroscience (61 citations). M.T. Bishop has collaborated with scholars based in United States, United Kingdom and Australia. Frequent co-authors include J.F. Witte, S.R. Mendis, John Preston, Mohammad Majid al‐Rifaie, William Latham, Frédéric Fol Leymarie, Aldri Santos, João Martins, David H. Cropley and Arthur J. Cropley. Their work appears in journals such as IEEE Computer Applications in Power, IEEE Transactions on Power Delivery, IEEE Industry Applications Magazine, Connection Science and IEEE Transactions on Industry Applications.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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