Michael A. O’Keefe
Impact in
- Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 31
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- Advanced Electron Microscopy Techniques and Applications 29
- Co-authors
- Nathaniel E. Brese (1 shared paper)Yang Shao‐Horn (3 shared papers)Claude Delmas (2 shared papers)E. Chris Nelson (3 shared papers)Laurence Croguennec (2 shared papers)William Krakow (2 shared papers)Lawrence F. Allard (7 shared papers)Douglas A. Blom (4 shared papers)
- Journals
- Microscopy and Microanalysis (13 papers)Ultramicroscopy (4 papers)Zeitschrift für Kristallographie (1 paper)Physical Review Letters (1 paper)Journal of the American Chemical Society (1 paper)
- Partner nations
- United StatesJapanUnited Kingdom
In The Last Decade
Michael A. O’Keefe
43 papers receiving 1.2k citations
Michael A. O’Keefe's Hit Papers
Peers
Comparison fields: 5 of 84
- Structural Biology 346
- Surfaces, Coatings and Films 318
- Inorganic Chemistry 278
- Radiation 125
- Electronic, Optical and Magnetic Materials 259
Countries citing papers authored by Michael A. O’Keefe
This map shows the geographic impact of Michael A. O’Keefe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael A. O’Keefe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael A. O’Keefe more than expected).
Fields of papers citing papers by Michael A. O’Keefe
This network shows the impact of papers produced by Michael A. O’Keefe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael A. O’Keefe. The network helps show where Michael A. O’Keefe may publish in the future.
Co-authors
The 25 scholars most cited alongside Michael A. O’Keefe, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 47 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Atom sizes and bond lengths in molecules and crystals Hit paper breakdown → | 1991 | 512 |
| 2 | 2003 | 229 | |
| 3 | 1992 | 94 | |
| 4 | Computer Simulation of Electron Microscope Diffraction and Images | 1989 | 76 |
| 5 | 1990 | 52 | |
| 6 | 2002 | 50 | |
| 7 | 2007 | 38 | |
| 8 | 2005 | 33 | |
| 9 | 1987 | 29 | |
| 10 | 2006 | 25 | |
| 11 | 2004 | 20 | |
| 12 | 1989 | 17 | |
| 13 | 1989 | 14 | |
| 14 | 2004 | 10 | |
| 15 | Atomic resolution of lithium ions in LiCoO{sub 2} | 2003 | 9 |
| 16 | 2005 | 8 | |
| 17 | 1993 | 8 | |
| 18 | 2004 | 6 | |
| 19 | 2004 | 4 | |
| 20 | 2000 | 4 |
About Michael A. O’Keefe
Michael A. O’Keefe is a scholar working on Surfaces, Coatings and Films, Structural Biology, Electrical and Electronic Engineering, Radiation and Materials Chemistry, having authored 47 papers that have together received 1.3k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (31 papers), Advanced Electron Microscopy Techniques and Applications (29 papers), Advanced X-ray Imaging Techniques (9 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Advancements in Photolithography Techniques (5 papers), Advanced Materials Characterization Techniques (4 papers), Surface and Thin Film Phenomena (3 papers) and Force Microscopy Techniques and Applications (2 papers). The work is most often cited by research in Structural Biology (346 citations), Surfaces, Coatings and Films (318 citations), Inorganic Chemistry (278 citations), Radiation (125 citations) and Electronic, Optical and Magnetic Materials (259 citations). Michael A. O’Keefe has collaborated with scholars based in United States, Japan and United Kingdom. Frequent co-authors include Nathaniel E. Brese, Yang Shao‐Horn, Claude Delmas, E. Chris Nelson, Laurence Croguennec, William Krakow, Lawrence F. Allard, Douglas A. Blom, Kenneth H. Downing and Hu Meisheng. Their work appears in journals such as Microscopy and Microanalysis, Ultramicroscopy, Zeitschrift für Kristallographie, Physical Review Letters and Journal of the American Chemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.