Mathias Senoner

608 citations
24 papers · 496 · h-index 11

Impact in

    • Advanced Electron Microscopy Techniques and Applications
  • Radiation top 10%
    • Advanced X-ray Imaging Techniques
    • X-ray Spectroscopy and Fluorescence Analysis

Papers in

Mathias Senoner

22 papers receiving 481 citations

Peers

Mathias Senoner
Comparison fields: 5 of 64
  • Structural Biology 66
  • Radiation 99
  • Surfaces, Coatings and Films 69
  • Spectroscopy 89
  • Computational Mechanics 110
Replace Hans Zeijlemaker with:
Hans Zeijlemaker Netherlands
Conrad Escher Switzerland
Jean-Nicolas Longchamp Switzerland
Richard A. McCorkle United States
W. Berthold Germany
B. Schiedt France
Sercan Keskin Germany
Hamed Tarawneh Sweden
Oliver Alexander United Kingdom
W. Wallauer Germany
Mathias Senoner relative to Hans Zeijlemaker Netherlands Hans Zeijlemaker's profile →
Citations per field
00.5×2×2.8×
Hans Zeijlemaker · 1×
Citations per year

Countries citing papers authored by Mathias Senoner

Since Specialization
Citations

This map shows the geographic impact of Mathias Senoner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mathias Senoner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mathias Senoner more than expected).

Fields of papers citing papers by Mathias Senoner

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mathias Senoner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mathias Senoner. The network helps show where Mathias Senoner may publish in the future.

Co-authors

The 25 scholars most cited alongside Mathias Senoner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Mathias Senoner Line = papers co-authored together Mathias Senoner links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200996
2 197992
3 201265
4 199344
5 197636
6 201034
7 201423
8 200419
9 200616
10 202015
11 201313
12
Testing of Lateral Resolution in the Nanometre Range Using the BAM-L002 - Certified Reference Material: Application to ToF-SIMS 4 and NanoESCA Instruments
20059
13 19868
14 20176
15 19805
16 19964
17 20214
18 19942
19 19992
20 19961

About Mathias Senoner

Mathias Senoner is a scholar working on Surfaces, Coatings and Films, Computational Mechanics, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Bioengineering, having authored 24 papers that have together received 496 indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (7 papers), Electron and X-Ray Spectroscopy Techniques (6 papers), Force Microscopy Techniques and Applications (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Advancements in Photolithography Techniques (3 papers), Optical Coatings and Gratings (3 papers), Quantum Dots Synthesis And Properties (2 papers) and Semiconductor Quantum Structures and Devices (2 papers). The work is most often cited by research in Structural Biology (66 citations), Radiation (99 citations), Surfaces, Coatings and Films (69 citations), Spectroscopy (89 citations) and Computational Mechanics (110 citations). Mathias Senoner has collaborated with scholars based in Germany, Switzerland and Italy. Frequent co-authors include Wolfgang E. S. Unger, J. Voigt, Andre Maaßdorf, Ilja Rückmann, Knut Rurack, Mikko Ritala, R. Fink, Tero Pilvi, Christian Dávid and Joan Vila‐Comamala. Their work appears in journals such as Surface and Interface Analysis, Journal of Analytical Atomic Spectrometry, physica status solidi (b), Analytical and Bioanalytical Chemistry and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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