Marcelo E. Valdes
Impact in
-
- Risk and Safety Analysis
-
- Occupational Health and Safety Research
Papers in
-
- Electrical Fault Detection and Protection 70
- Integrated Circuits and Semiconductor Failure Analysis 9
-
- Risk and Safety Analysis 34
- Co-authors
- S. A. Saleh (22 shared papers)Ahmed Al‐Durra (12 shared papers)Peter E. Sutherland (9 shared papers)E. Ozkop (11 shared papers)Julian Meng (9 shared papers)S. Hansen (5 shared papers)John J. Dougherty (4 shared papers)Basim Alsayid (2 shared papers)
- Journals
- IEEE Transactions on Industry Applications (23 papers)IEEE Industry Applications Magazine (10 papers)Ozone Science and Engineering (1 paper)Consultation of the Doctoral Thesis Database (TESEO) (Ministerio de Educación, Cultura y Deporte) (1 paper)2021 IEEE Industry Applications Society Annual Meeting (IAS) (1 paper)
- Partner nations
- United StatesCanadaUnited Arab Emirates
In The Last Decade
Marcelo E. Valdes
77 papers receiving 593 citations
Peers
Comparison fields: 5 of 51
- Statistics, Probability and Uncertainty 155
- Radiological and Ultrasound Technology 86
- Medical Laboratory Technology 20
- Electrical and Electronic Engineering 651
- Control and Systems Engineering 212
Countries citing papers authored by Marcelo E. Valdes
This map shows the geographic impact of Marcelo E. Valdes's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Marcelo E. Valdes with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Marcelo E. Valdes more than expected).
Fields of papers citing papers by Marcelo E. Valdes
This network shows the impact of papers produced by Marcelo E. Valdes. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Marcelo E. Valdes. The network helps show where Marcelo E. Valdes may publish in the future.
Co-authors
The 24 scholars most cited alongside Marcelo E. Valdes, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 89 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2019 | 54 | |
| 2 | 2003 | 54 | |
| 3 | 2022 | 30 | |
| 4 | 2023 | 26 | |
| 5 | 2012 | 26 | |
| 6 | 2023 | 25 | |
| 7 | 2023 | 24 | |
| 8 | 2022 | 22 | |
| 9 | 2011 | 22 | |
| 10 | 2022 | 20 | |
| 11 | 2012 | 19 | |
| 12 | 2023 | 18 | |
| 13 | 2010 | 18 | |
| 14 | 2024 | 17 | |
| 15 | 2023 | 16 | |
| 16 | 2023 | 15 | |
| 17 | 2013 | 15 | |
| 18 | 2005 | 14 | |
| 19 | 2007 | 12 | |
| 20 | 2004 | 11 |
About Marcelo E. Valdes
Marcelo E. Valdes is a scholar working on Electrical and Electronic Engineering, Statistics, Probability and Uncertainty, Control and Systems Engineering, Mechanical Engineering and Radiological and Ultrasound Technology, having authored 89 papers that have together received 709 indexed citations. Recurring topics across this work include Electrical Fault Detection and Protection (70 papers), Risk and Safety Analysis (34 papers), Power Systems Fault Detection (18 papers), Smart Grid Security and Resilience (13 papers), Occupational Health and Safety Research (12 papers), Lightning and Electromagnetic Phenomena (11 papers), Quality and Safety in Healthcare (10 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). The work is most often cited by research in Statistics, Probability and Uncertainty (155 citations), Radiological and Ultrasound Technology (86 citations), Medical Laboratory Technology (20 citations), Electrical and Electronic Engineering (651 citations) and Control and Systems Engineering (212 citations). Marcelo E. Valdes has collaborated with scholars based in United States, Canada and United Arab Emirates. Frequent co-authors include S. A. Saleh, Ahmed Al‐Durra, Peter E. Sutherland, E. Ozkop, Julian Meng, S. Hansen, John J. Dougherty, Basim Alsayid, J. Ribas and Sergio Panetta. Their work appears in journals such as IEEE Transactions on Industry Applications, IEEE Industry Applications Magazine, Ozone Science and Engineering, Consultation of the Doctoral Thesis Database (TESEO) (Ministerio de Educación, Cultura y Deporte) and 2021 IEEE Industry Applications Society Annual Meeting (IAS).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.