M. Kruer

29 papers receiving 929 citations

Peers

M. Kruer
Comparison fields: 5 of 70
  • Instrumentation 65
  • Ophthalmology 127
  • Aerospace Engineering 386
  • Computational Mechanics 249
  • Electrical and Electronic Engineering 595
Replace D. R. Hall with:
D. R. Hall United Kingdom
Zhenxu Bai China
G. Herziger Germany
Kim A. Winick United States
Vincent Goiffon France
C.J. Dale United States
Edward I. Moses United States
F.H. Dill United States
Giuseppe Molesini Italy
Cheryl J. Marshall United States
M. Kruer relative to D. R. Hall United Kingdom D. R. Hall's profile →
Citations per field
00.5×8.8×
D. R. Hall · 1×
Citations per year

Countries citing papers authored by M. Kruer

Since Specialization
Citations

This map shows the geographic impact of M. Kruer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Kruer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Kruer more than expected).

Fields of papers citing papers by M. Kruer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Kruer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Kruer. The network helps show where M. Kruer may publish in the future.

Co-authors

The 19 scholars most cited alongside M. Kruer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Kruer Line = papers co-authored together M. Kruer links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 29 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1991165
2 1980161
3 1985140
4 198097
5 197782
6 200275
7 197459
8 197638
9 197523
10 197723
11 197618
12 198818
13 197512
14 197511
15 197311
16 197610
17 19879
18 19879
19 19767
20 19786

About M. Kruer

M. Kruer is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering, Computational Mechanics, Ophthalmology and Mechanics of Materials, having authored 29 papers that have together received 1.0k indexed citations. Recurring topics across this work include Infrared Target Detection Methodologies (13 papers), Advanced Semiconductor Detectors and Materials (9 papers), Laser Material Processing Techniques (8 papers), Ocular and Laser Science Research (7 papers), Calibration and Measurement Techniques (7 papers), Thermography and Photoacoustic Techniques (6 papers), Advanced Optical Sensing Technologies (4 papers) and Optical and Acousto-Optic Technologies (3 papers). The work is most often cited by research in Instrumentation (65 citations), Ophthalmology (127 citations), Aerospace Engineering (386 citations), Computational Mechanics (249 citations) and Electrical and Electronic Engineering (595 citations). M. Kruer has collaborated with scholars based in United States. Frequent co-authors include F. J. Bartoli, J. R. Meyer, D. Scribner, R. Allen, L. Esterowitz, J. M. Killiany, A. F. Milton, Kenneth A. Sarkady, Michael R. Descour and John Caulfield. Their work appears in journals such as Journal of Applied Physics, IEEE Geoscience and Remote Sensing Letters, Optical Engineering, Physical review. B, Condensed matter and Experimental Gerontology.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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