Kun Yuan

14 papers and 198 indexed citations .

Kun Yuan is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computer Networks and Communications. According to data from OpenAlex, Kun Yuan has authored 14 papers receiving a total of 198 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Electrical and Electronic Engineering, 8 papers in Hardware and Architecture and 3 papers in Computer Networks and Communications. Recurrent topics in Kun Yuan’s work include VLSI and Analog Circuit Testing (8 papers), Advancements in Photolithography Techniques (8 papers) and VLSI and FPGA Design Techniques (7 papers). Kun Yuan is often cited by papers focused on VLSI and Analog Circuit Testing (8 papers), Advancements in Photolithography Techniques (8 papers) and VLSI and FPGA Design Techniques (7 papers). Kun Yuan collaborates with scholars based in United States, China and Hong Kong. Kun Yuan's co-authors include David Z. Pan, Minsik Cho, Jae-Seok Yang, Bei Yu, Duo Ding, Yongchan Ban, Kaifeng Zhang, Zhihua Li, Qianqian Liu and Yonghui Liu and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Wireless Personal Communications and ACM Transactions on Design Automation of Electronic Systems.