Kun Yuan

20 papers and 365 indexed citations i.

Kun Yuan is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering. According to data from OpenAlex, Kun Yuan has authored 20 papers receiving a total of 365 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 13 papers in Hardware and Architecture and 4 papers in Biomedical Engineering. Recurrent topics in Kun Yuan’s work include Advancements in Photolithography Techniques (14 papers), VLSI and Analog Circuit Testing (13 papers) and VLSI and FPGA Design Techniques (10 papers). Kun Yuan is often cited by papers focused on Advancements in Photolithography Techniques (14 papers), VLSI and Analog Circuit Testing (13 papers) and VLSI and FPGA Design Techniques (10 papers). Kun Yuan collaborates with scholars based in United States, China and Hong Kong. Kun Yuan's co-authors include David Z. Pan, Jae-Seok Yang, Minsik Cho, Bei Yu, Duo Ding, Boyang Zhang, Yongchan Ban, Ying Wang, Kaifeng Zhang and Yonghui Liu and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Wireless Personal Communications and ACM Transactions on Design Automation of Electronic Systems.