Jeff Beck
Impact in
- Instrumentation top 5%
- Advanced Optical Sensing Technologies
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- Advanced Semiconductor Detectors and Materials
- Photonic and Optical Devices
- Chalcogenide Semiconductor Thin Films
- Advanced MEMS and NEMS Technologies
Papers in
-
- Advanced Semiconductor Detectors and Materials 26
- Photonic and Optical Devices 4
- Chalcogenide Semiconductor Thin Films 3
-
- Advanced Optical Sensing Technologies 16
- Co-authors
- M. A. Kinch (10 shared papers)Feng Ma (4 shared papers)Pradip Mitra (11 shared papers)Chang-Feng Wan (2 shared papers)J.H. Campbell (1 shared paper)J. H. Tregilgas (3 shared papers)Bruce E. Gnade (2 shared papers)H. F. Schaake (4 shared papers)
- Journals
- Journal of Electronic Materials (6 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (3 papers)IEEE Journal of Selected Topics in Quantum Electronics (2 papers)Applied Physics Letters (1 paper)Sensors (1 paper)
- Partner nations
- United StatesAustraliaNetherlands
In The Last Decade
Jeff Beck
34 papers receiving 643 citations
Peers
Comparison fields: 5 of 44
- Instrumentation 217
- Electrical and Electronic Engineering 580
- Atomic and Molecular Physics, and Optics 281
- Radiation 36
- Aerospace Engineering 95
Countries citing papers authored by Jeff Beck
This map shows the geographic impact of Jeff Beck's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeff Beck with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeff Beck more than expected).
Fields of papers citing papers by Jeff Beck
This network shows the impact of papers produced by Jeff Beck. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeff Beck. The network helps show where Jeff Beck may publish in the future.
Co-authors
The 25 scholars most cited alongside Jeff Beck, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 35 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 155 | |
| 2 | 2004 | 104 | |
| 3 | 1985 | 60 | |
| 4 | 2005 | 51 | |
| 5 | 2014 | 35 | |
| 6 | 2019 | 30 | |
| 7 | 1989 | 29 | |
| 8 | 2008 | 27 | |
| 9 | 1982 | 26 | |
| 10 | 2008 | 21 | |
| 11 | 1985 | 18 | |
| 12 | 2007 | 15 | |
| 13 | 2015 | 13 | |
| 14 | 1989 | 10 | |
| 15 | 2021 | 9 | |
| 16 | 2005 | 8 | |
| 17 | 1984 | 8 | |
| 18 | 2013 | 8 | |
| 19 | 1993 | 7 | |
| 20 | 2020 | 7 |
About Jeff Beck
Jeff Beck is a scholar working on Electrical and Electronic Engineering, Instrumentation, Atomic and Molecular Physics, and Optics, Biomedical Engineering and Aerospace Engineering, having authored 35 papers that have together received 688 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (26 papers), Advanced Optical Sensing Technologies (16 papers), Semiconductor Quantum Structures and Devices (6 papers), Photonic and Optical Devices (4 papers), Advanced X-ray and CT Imaging (3 papers), Radiation Detection and Scintillator Technologies (3 papers), Chalcogenide Semiconductor Thin Films (3 papers) and Calibration and Measurement Techniques (3 papers). The work is most often cited by research in Instrumentation (217 citations), Electrical and Electronic Engineering (580 citations), Atomic and Molecular Physics, and Optics (281 citations), Radiation (36 citations) and Aerospace Engineering (95 citations). Jeff Beck has collaborated with scholars based in United States, Australia and Netherlands. Frequent co-authors include M. A. Kinch, Feng Ma, Pradip Mitra, Chang-Feng Wan, J.H. Campbell, J. H. Tregilgas, Bruce E. Gnade, H. F. Schaake, James B. Abshire and Xiaoli Sun. Their work appears in journals such as Journal of Electronic Materials, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, IEEE Journal of Selected Topics in Quantum Electronics, Applied Physics Letters and Sensors.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.