Ivan Ohlı́dal

186 papers receiving 2.7k citations

Peers

Ivan Ohlı́dal
Comparison fields: 5 of 95
  • Surfaces, Coatings and Films 720
  • Computational Mechanics 1.2k
  • Biomedical Engineering 819
  • Electrical and Electronic Engineering 1.1k
  • Atomic and Molecular Physics, and Optics 524
Replace Daniel Franta with:
Daniel Franta Czechia
E. Pelletier France
T. Smy Canada
Gediminas Račiukaitis Lithuania
Wanguo Zheng China
Angela Duparré Germany
Laurent Gallais France
Xiaodong Yuan China
Arturo A. Ayón United States
John S. Villarrubia United States
Ivan Ohlı́dal relative to Daniel Franta Czechia Daniel Franta's profile →
Citations per field
00.5×1.6×
Daniel Franta · 1×
Citations per year

Countries citing papers authored by Ivan Ohlı́dal

Since Specialization
Citations

This map shows the geographic impact of Ivan Ohlı́dal's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ivan Ohlı́dal with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ivan Ohlı́dal more than expected).

Fields of papers citing papers by Ivan Ohlı́dal

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ivan Ohlı́dal. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ivan Ohlı́dal. The network helps show where Ivan Ohlı́dal may publish in the future.

Co-authors

The 25 scholars most cited alongside Ivan Ohlı́dal, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Ivan Ohlı́dal Line = papers co-authored together Ivan Ohlı́dal links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 191 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2016374
2 197298
3 197482
4 200481
5 197169
6 199865
7 200064
8 201553
9 201751
10 200547
11 199537
12 201137
13 200235
14 200035
15 201734
16 200233
17 201133
18 201130
19 200430
20 200629

About Ivan Ohlı́dal

Ivan Ohlı́dal is a scholar working on Computational Mechanics, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering and Materials Chemistry, having authored 191 papers that have together received 2.8k indexed citations. Recurring topics across this work include Surface Roughness and Optical Measurements (120 papers), Optical Coatings and Gratings (59 papers), Optical Polarization and Ellipsometry (32 papers), Thin-Film Transistor Technologies (29 papers), Advanced Measurement and Metrology Techniques (24 papers), Optical measurement and interference techniques (18 papers), Force Microscopy Techniques and Applications (16 papers) and Diamond and Carbon-based Materials Research (15 papers). The work is most often cited by research in Surfaces, Coatings and Films (720 citations), Computational Mechanics (1.2k citations), Biomedical Engineering (819 citations), Electrical and Electronic Engineering (1.1k citations) and Atomic and Molecular Physics, and Optics (524 citations). Ivan Ohlı́dal has collaborated with scholars based in Czechia, Austria and Japan. Frequent co-authors include Daniel Franta, David Nečas, F. Lukeš, K. Navrátil, Petr Klapetek, Miloslav Ohlídal, Jiří Vohánka, Martin Čermák, Lenka Zajı́čková and Vilma Buršı́ková. Their work appears in journals such as Thin Solid Films, Applied Surface Science, Surface and Interface Analysis, Journal of Modern Optics and Diamond and Related Materials.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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