Ivan Ohlı́dal
Impact in
- Surfaces, Coatings and Films top 0.5%
- Optical Coatings and Gratings
- Computational Mechanics top 1%
- Surface Roughness and Optical Measurements
Papers in
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- Surface Roughness and Optical Measurements 112
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- Thin-Film Transistor Technologies 29
- Co-authors
- Daniel Franta (107 shared papers)F. Lukeš (12 shared papers)David Nečas (40 shared papers)K. Navrátil (20 shared papers)Petr Klapetek (37 shared papers)Miloslav Ohlídal (38 shared papers)Jiří Vohánka (32 shared papers)Martin Čermák (19 shared papers)
In The Last Decade
Ivan Ohlı́dal
175 papers receiving 2.4k citations
Peers
Comparison fields: 5 of 91
- Surfaces, Coatings and Films 630
- Computational Mechanics 1.0k
- Biomedical Engineering 753
- Electrical and Electronic Engineering 979
- Materials Chemistry 723
Countries citing papers authored by Ivan Ohlı́dal
This map shows the geographic impact of Ivan Ohlı́dal's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ivan Ohlı́dal with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ivan Ohlı́dal more than expected).
Fields of papers citing papers by Ivan Ohlı́dal
This network shows the impact of papers produced by Ivan Ohlı́dal. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ivan Ohlı́dal. The network helps show where Ivan Ohlı́dal may publish in the future.
Co-authors
The 25 scholars most cited alongside Ivan Ohlı́dal, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 180 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 369 | |
| 2 | 1972 | 91 | |
| 3 | 1974 | 77 | |
| 4 | 2004 | 76 | |
| 5 | 1971 | 65 | |
| 6 | 1998 | 61 | |
| 7 | 2015 | 49 | |
| 8 | 2017 | 48 | |
| 9 | 2005 | 46 | |
| 10 | 2000 | 34 | |
| 11 | 2011 | 34 | |
| 12 | 2002 | 33 | |
| 13 | 2017 | 33 | |
| 14 | 2011 | 30 | |
| 15 | 2002 | 30 | |
| 16 | 2011 | 30 | |
| 17 | 2006 | 29 | |
| 18 | 2004 | 28 | |
| 19 | 2005 | 27 | |
| 20 | 2003 | 26 |
About Ivan Ohlı́dal
Ivan Ohlı́dal is a scholar working on Computational Mechanics, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering and Materials Chemistry, having authored 180 papers that have together received 2.5k indexed citations. Recurring topics across this work include Surface Roughness and Optical Measurements (112 papers), Optical Coatings and Gratings (55 papers), Optical Polarization and Ellipsometry (31 papers), Thin-Film Transistor Technologies (29 papers), Advanced Measurement and Metrology Techniques (21 papers), Optical measurement and interference techniques (18 papers), Diamond and Carbon-based Materials Research (15 papers) and Force Microscopy Techniques and Applications (14 papers). The work is most often cited by research in Surfaces, Coatings and Films (630 citations), Computational Mechanics (1.0k citations), Biomedical Engineering (753 citations), Electrical and Electronic Engineering (979 citations) and Materials Chemistry (723 citations). Ivan Ohlı́dal has collaborated with scholars based in Czechia, Austria and Japan. Frequent co-authors include Daniel Franta, F. Lukeš, David Nečas, K. Navrátil, Petr Klapetek, Miloslav Ohlídal, Jiří Vohánka, Martin Čermák, Lenka Zajı́čková and Vilma Buršı́ková. Their work appears in journals such as Thin Solid Films, Applied Surface Science, Surface and Interface Analysis, Journal of Modern Optics and Diamond and Related Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.