H.L. Peek

549 citations

36 papers · 391 · h-index 9

Impact in

Instrumentation
Media Technology top 10%
- Image Processing Techniques and Applications

Papers in

Electrical and Electronic Engineering 35
- CCD and CMOS Imaging Sensors 25
- Thin-Film Transistor Technologies 7
- Semiconductor materials and devices 6
Media Technology 10
- Image Processing Techniques and Applications 10

Co-authors: F. C. Eversteyn (1 shared paper)P. J. Severin (1 shared paper)D. R. Wolters (2 shared papers)Albert Theuwissen (11 shared papers)J.F. Verwey (2 shared papers)R. Cuppens (2 shared papers)J.W. Slotboom (2 shared papers)J.A. Pals (1 shared paper)
Journals: IEEE Transactions on Electron Devices (9 papers)IEEE Journal of Solid-State Circuits (2 papers)Japanese Journal of Applied Physics (1 paper)Journal of The Electrochemical Society (1 paper)Solid-State Electronics (1 paper)
Partner nations: Netherlands Finland United States

In The Last Decade

H.L. Peek

32 papers receiving 340 citations

Peers

Countries citing papers authored by H.L. Peek

Since Specialization

Citations

This map shows the geographic impact of H.L. Peek's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H.L. Peek with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H.L. Peek more than expected).

Fields of papers citing papers by H.L. Peek

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H.L. Peek. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H.L. Peek. The network helps show where H.L. Peek may publish in the future.

Co-authors

The 16 scholars most cited alongside H.L. Peek, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with H.L. Peek Line = papers co-authored together H.L. Peek links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 36 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	A Stagnant Layer Model for the Epitaxial Growth of Silicon from Silane in a Horizontal Reactor Journal of The Electrochemical Society ·F. C. Eversteyn, P. J. Severin, C. H. J. v. d. Brekel, H.L. Peek	1970	195
2	A frame-transfer CCD color imager with vertical antiblooming IEEE Transactions on Electron Devices ·M. J. H. van de Steeg, H.L. Peek, J. Bakker, J.A. Pals, Bart G. M. Dillen, J.M.A.M. Oppers	1985	22
3	Fowler-Nordheim tunneling in implanted MOS devices Solid-State Electronics ·D. R. Wolters, H.L. Peek	1987	18
4	An EEPROM for microprocessors and custom logic IEEE Journal of Solid-State Circuits ·R. Cuppens, C.D. Hartgring, J.F. Verwey, H.L. Peek, F.A.H. Vollebragt, E.G.M. Devens, I.A. Sens	1985	16
5	Anomalous behavior of surface leakage currents in heavily doped gated-diodes IEEE Transactions on Electron Devices ·Fred Hurkx, H.L. Peek, J.W. Slotboom, R. A. Windgassen	1993	13
6	A 2.2 M pixel FT-CCD imager according to the Eureka HDTV standard IEEE Transactions on Electron Devices ·Albert Theuwissen, H.L. Peek, M. J. H. van de Steeg, R. Boesten, Peter Hartog, A.L. Kokshorn, Eelco A. De Koning, J.M.A.M. Oppers, F.F. Vledder, Peter Centen, Henk M. Blom, Wim Haar	1993	12
7	Frame transfer CCDs for digital still cameras: concept, design, and evaluation IEEE Transactions on Electron Devices ·J.T. Bosiers, A.C. Kleimann, H.C. van Kuijk, Laurent Le Cam, H.L. Peek, J.P. Maas, Albert Theuwissen	2002	10
8	An EEPROM for microprocessors and custom logic R. Cuppens, C.D. Hartgring, J.F. Verwey, H.L. Peek	1984	9
9	High Density Frame Transfer Image Sensor Japanese Journal of Applied Physics ·G. A. Beck, M.G. Collet, J. A. A. van Gils, A. J. Klinkhamer, H.L. Peek, W. N. J. Ruis, J. G. van Santen, Thorsten Smit, G. T. J. Vandormael	1983	8
10	An S-VHS compatible 1/3" color FT-CCD imager with low dark current by surface pinning IEEE Transactions on Electron Devices ·J.T. Bosiers, E. Roks, H.L. Peek, A.C. Kleimann, A.G. van der Sijde	1995	8
11	Twin-layer PCCD performance for different doping levels of the surface layer IEEE Transactions on Electron Devices ·H.L. Peek	1976	7
12	Groove-fill of tungsten and poly-Si membrane technology for high performance (HDTV) FT-CCD imagers H.L. Peek, Albert Theuwissen, A. Kokshoorn, E.J.M. Daemen	2002	6
13	A 35-mm format 11 M pixel full-frame CCDfor professional digital still imaging IEEE Transactions on Electron Devices ·J.T. Bosiers, Bart G. M. Dillen, Cees Draijer, A.C. Kleimann, Frank Polderdijk, M.A.R.C. de Wolf, Wilco Klaassens, Albert Theuwissen, H.L. Peek, H. Folkerts	2003	6
14	A low dark current double membrane poly-Si FT-technology for 2/3 inch 6M pixel CCD imagers H.L. Peek, W.E. Verbugt, H. Heijns	2003	5
15	A 1/3" progressive scan 1280(H)×960(V) FT-CCD for digital still camera applications J.T. Bosiers, Y.A. Beorsma, A.C. Kleimann, D.W. Verbugt, H.L. Peek, A.G. van der Sijde	2002	5
16	Twin layer PCCD performance for different doping levels of the surface layer IEEE Journal of Solid-State Circuits ·H.L. Peek	1976	5
17	A 1/1.8" 3M pixel FT-CCD with on-chip horizontal sub-sampling for DSC applications 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) ·Laurent Le Cam, J.T. Bosiers, A.C. Kleimann, H.C. van Kuijk, J.P. Maas, Monique J. Beenhakkers, H.L. Peek, P.C. van de Rijt, Albert Theuwissen	2003	5
18	Versatile building-block architecture for large-area high-performance CCD imagers Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Albert Theuwissen, Monique J. Beenhakkers, Bart G. M. Dillen, Hein O. Folkerts, Henk Heyns, Laurens Korthout, G. Kreider, P. Opmeer, H.L. Peek, E. Roks, Helmut Rosner, Arjen van der Sijde, F.F. Vledder	1998	4
19	A 2/3" 2-M pixel progressive scan FT-CCD for digital still camera applications J.T. Bosiers, A.C. Kleimann, Arjen van der Sijde, Laurens Korthout, D.W. Verbugt, H.L. Peek, E. Roks, A. Heringa, F.F. Vledder, P. Opmeer	2002	4
20	A 2/3-in 1187(H)581(V) S-VHS-compatible frame-transfer CCD for ESP and movie mode IEEE Transactions on Electron Devices* ·J.T. Bosiers, A.C. Kleimann, Bart G. M. Dillen, H.L. Peek, A. Kokshoorn, Noortje Daemen, A.G. van der Sijde, L.T. van Gaal	1991	4

About H.L. Peek

H.L. Peek is a scholar working on Electrical and Electronic Engineering, Media Technology, Aerospace Engineering, Computer Vision and Pattern Recognition and Biomedical Engineering, having authored 36 papers that have together received 391 indexed citations. Recurring topics across this work include CCD and CMOS Imaging Sensors (25 papers), Image Processing Techniques and Applications (10 papers), Infrared Target Detection Methodologies (10 papers), Thin-Film Transistor Technologies (7 papers), Semiconductor materials and devices (6 papers), Advanced Optical Sensing Technologies (5 papers), Image Enhancement Techniques (4 papers) and Advanced Image Processing Techniques (4 papers). The work is most often cited by research in Instrumentation (20 citations), Media Technology (47 citations), Electrical and Electronic Engineering (290 citations), Bioengineering (17 citations) and Aerospace Engineering (59 citations). H.L. Peek has collaborated with scholars based in Netherlands, Finland and United States. Frequent co-authors include F. C. Eversteyn, P. J. Severin, D. R. Wolters, Albert Theuwissen, J.F. Verwey, R. Cuppens, J.W. Slotboom, J.A. Pals, Monique J. Beenhakkers and Laurent Le Cam. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Journal of Solid-State Circuits, Japanese Journal of Applied Physics, Journal of The Electrochemical Society and Solid-State Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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H.L. Peek

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