Frank SALVAN
Impact in
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- Surface and Thin Film Phenomena
- Force Microscopy Techniques and Applications
- Semiconductor materials and interfaces
- Semiconductor Quantum Structures and Devices
- Advanced Chemical Physics Studies
- Structural Biology top 2%
Papers in
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- Surface and Thin Film Phenomena 40
- Force Microscopy Techniques and Applications 18
- Semiconductor materials and interfaces 18
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- Electron and X-Ray Spectroscopy Techniques 18
- Co-authors
- Gerd K. Binnig (6 shared papers)J. Derrien (19 shared papers)B. Reihl (5 shared papers)Harald Fuchs (4 shared papers)Heinrich Rohrer (4 shared papers)Anne Cros (15 shared papers)Nicolás García (2 shared papers)A. R. Williams (2 shared papers)
- Journals
- Surface Science (17 papers)Physical Review Letters (4 papers)Applied Physics Letters (4 papers)Europhysics Letters (EPL) (3 papers)Thin Solid Films (2 papers)
- Partner nations
- FranceSwitzerlandUnited States
In The Last Decade
Frank SALVAN
69 papers receiving 2.2k citations
Peers
Comparison fields: 5 of 58
- Atomic and Molecular Physics, and Optics 1.9k
- Structural Biology 88
- Surfaces, Coatings and Films 412
- Electrical and Electronic Engineering 953
- Materials Chemistry 682
Countries citing papers authored by Frank SALVAN
This map shows the geographic impact of Frank SALVAN's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Frank SALVAN with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Frank SALVAN more than expected).
Fields of papers citing papers by Frank SALVAN
This network shows the impact of papers produced by Frank SALVAN. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Frank SALVAN. The network helps show where Frank SALVAN may publish in the future.
Co-authors
The 25 scholars most cited alongside Frank SALVAN, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 71 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1985 | 363 | |
| 2 | 1969 | 297 | |
| 3 | 1985 | 207 | |
| 4 | 1972 | 117 | |
| 5 | 1981 | 111 | |
| 6 | 1984 | 109 | |
| 7 | 1985 | 100 | |
| 8 | 1986 | 69 | |
| 9 | 1983 | 64 | |
| 10 | 1985 | 62 | |
| 11 | 1988 | 56 | |
| 12 | 1986 | 46 | |
| 13 | 1970 | 44 | |
| 14 | 1985 | 42 | |
| 15 | 1978 | 39 | |
| 16 | 1993 | 37 | |
| 17 | 1980 | 33 | |
| 18 | 1971 | 32 | |
| 19 | 1980 | 30 | |
| 20 | 1994 | 30 |
About Frank SALVAN
Frank SALVAN is a scholar working on Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Structural Biology, Biomedical Engineering and Electrical and Electronic Engineering, having authored 71 papers that have together received 2.4k indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (40 papers), Force Microscopy Techniques and Applications (18 papers), Semiconductor materials and interfaces (18 papers), Electron and X-Ray Spectroscopy Techniques (18 papers), Advanced Materials Characterization Techniques (15 papers), Semiconductor materials and devices (13 papers), Silicon Nanostructures and Photoluminescence (7 papers) and Advanced Electron Microscopy Techniques and Applications (6 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (1.9k citations), Structural Biology (88 citations), Surfaces, Coatings and Films (412 citations), Electrical and Electronic Engineering (953 citations) and Materials Chemistry (682 citations). Frank SALVAN has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include Gerd K. Binnig, J. Derrien, B. Reihl, Harald Fuchs, Heinrich Rohrer, Anne Cros, Nicolás García, A. R. Williams, K. H. Frank and C. Benoît à la Guillaume. Their work appears in journals such as Surface Science, Physical Review Letters, Applied Physics Letters, Europhysics Letters (EPL) and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.