F. Thon
Impact in
- Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 9
-
- Advanced Electron Microscopy Techniques and Applications 6
- Co-authors
- Benjamin M. Siegel (1 shared paper)Maurice Halioua (2 shared papers)George W. Stroke (2 shared papers)
- Journals
- Berichte der Bunsengesellschaft für physikalische Chemie (1 paper)Proceedings of the IEEE (1 paper)Zeitschrift für Naturforschung A (2 papers)Proceedings annual meeting Electron Microscopy Society of America (4 papers)Physikalische Blätter (1 paper)
- Partner nations
- GermanyUnited States
In The Last Decade
F. Thon
9 papers receiving 360 citations
Peers
Comparison fields: 5 of 57
- Structural Biology 280
- Surfaces, Coatings and Films 217
- Radiation 122
- Media Technology 45
- Biophysics 27
Countries citing papers authored by F. Thon
This map shows the geographic impact of F. Thon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Thon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Thon more than expected).
Fields of papers citing papers by F. Thon
This network shows the impact of papers produced by F. Thon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Thon. The network helps show where F. Thon may publish in the future.
Co-authors
The 3 scholars most cited alongside F. Thon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1966 | 231 | |
| 2 | 1971 | 62 | |
| 3 | 1965 | 56 | |
| 4 | 1977 | 31 | |
| 5 | 1970 | 25 | |
| 6 | 1971 | 9 | |
| 7 | 1967 | 8 | |
| 8 | 1975 | 2 | |
| 9 | 1974 | 1 | |
| 10 | 1971 | 1 |
About F. Thon
F. Thon is a scholar working on Surfaces, Coatings and Films, Structural Biology, Radiation, Media Technology and Electrical and Electronic Engineering, having authored 10 papers that have together received 426 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (9 papers), Advanced Electron Microscopy Techniques and Applications (6 papers), Advanced X-ray Imaging Techniques (3 papers), Advancements in Photolithography Techniques (2 papers), High voltage insulation and dielectric phenomena (1 paper), Digital Holography and Microscopy (1 paper), Power Transformer Diagnostics and Insulation (1 paper) and Advanced Optical Imaging Technologies (1 paper). The work is most often cited by research in Structural Biology (280 citations), Surfaces, Coatings and Films (217 citations), Radiation (122 citations), Media Technology (45 citations) and Biophysics (27 citations). F. Thon has collaborated with scholars based in Germany and United States. Frequent co-authors include Benjamin M. Siegel, Maurice Halioua and George W. Stroke. Their work appears in journals such as Berichte der Bunsengesellschaft für physikalische Chemie, Proceedings of the IEEE, Zeitschrift für Naturforschung A, Proceedings annual meeting Electron Microscopy Society of America and Physikalische Blätter.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.