F. Senf
Impact in
- Radiation top 0.5%
- Advanced X-ray Imaging Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Surfaces, Coatings and Films top 1%
- Electron and X-Ray Spectroscopy Techniques
- Optical Coatings and Gratings
Papers in
- Radiation 39
- Advanced X-ray Imaging Techniques 29
- X-ray Spectroscopy and Fluorescence Analysis 19
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- Optical Coatings and Gratings 10
- Electron and X-Ray Spectroscopy Techniques 10
- Co-authors
- R. Follath (16 shared papers)Wolfgang Gudat (11 shared papers)Frank Eggenstein (16 shared papers)Kawal J. S. Sawhney (6 shared papers)F. Schäfers (11 shared papers)J. Bahrdt (8 shared papers)Thomas Zeschke (14 shared papers)Andreas Gaupp (8 shared papers)
- Journals
- Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment (13 papers)Review of Scientific Instruments (8 papers)Journal of Synchrotron Radiation (7 papers)Journal of Electron Spectroscopy and Related Phenomena (4 papers)Surface Science (2 papers)
- Partner nations
- GermanyUnited StatesSweden
In The Last Decade
F. Senf
61 papers receiving 1.6k citations
Peers
Comparison fields: 5 of 45
- Radiation 817
- Surfaces, Coatings and Films 390
- Condensed Matter Physics 156
- Instrumentation 31
- Electrical and Electronic Engineering 546
Countries citing papers authored by F. Senf
This map shows the geographic impact of F. Senf's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Senf with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Senf more than expected).
Fields of papers citing papers by F. Senf
This network shows the impact of papers produced by F. Senf. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Senf. The network helps show where F. Senf may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Senf, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 64 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2006 | 266 | |
| 2 | 2009 | 140 | |
| 3 | 1997 | 113 | |
| 4 | 1997 | 106 | |
| 5 | 2001 | 94 | |
| 6 | 1998 | 93 | |
| 7 | 1987 | 53 | |
| 8 | 2015 | 48 | |
| 9 | 1986 | 44 | |
| 10 | 1998 | 43 | |
| 11 | 2001 | 41 | |
| 12 | 2017 | 41 | |
| 13 | 1990 | 39 | |
| 14 | 2016 | 39 | |
| 15 | 2016 | 38 | |
| 16 | 1987 | 32 | |
| 17 | 2019 | 32 | |
| 18 | 2001 | 31 | |
| 19 | 1995 | 30 | |
| 20 | 2014 | 27 |
About F. Senf
F. Senf is a scholar working on Radiation, Surfaces, Coatings and Films, Condensed Matter Physics, Electrical and Electronic Engineering and Instrumentation, having authored 64 papers that have together received 1.7k indexed citations. Recurring topics across this work include Particle Accelerators and Free-Electron Lasers (32 papers), Advanced X-ray Imaging Techniques (29 papers), X-ray Spectroscopy and Fluorescence Analysis (19 papers), Crystallography and Radiation Phenomena (14 papers), Optical Coatings and Gratings (10 papers), Electron and X-Ray Spectroscopy Techniques (10 papers), Advanced Measurement and Metrology Techniques (6 papers) and Surface Roughness and Optical Measurements (3 papers). The work is most often cited by research in Radiation (817 citations), Surfaces, Coatings and Films (390 citations), Condensed Matter Physics (156 citations), Instrumentation (31 citations) and Electrical and Electronic Engineering (546 citations). F. Senf has collaborated with scholars based in Germany, United States and Sweden. Frequent co-authors include R. Follath, Wolfgang Gudat, Frank Eggenstein, Kawal J. S. Sawhney, F. Schäfers, J. Bahrdt, Thomas Zeschke, Andreas Gaupp, Frank Siewert and Heiner Lammert. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, Review of Scientific Instruments, Journal of Synchrotron Radiation, Journal of Electron Spectroscopy and Related Phenomena and Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.