F. Krafft
Impact in
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- Semiconductor Quantum Structures and Devices
- Semiconductor materials and interfaces
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- Semiconductor materials and devices
- Silicon and Solar Cell Technologies
- Photonic and Optical Devices
- Advanced Semiconductor Detectors and Materials
Papers in
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- Electrowetting and Microfluidic Technologies 1
- Semiconductor materials and devices 1
- Photonic and Optical Devices 1
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- Semiconductor Quantum Structures and Devices 2
- Semiconductor materials and interfaces 2
- Co-authors
- Stanisław Krawczyk (4 shared papers)Pierre Abraham (1 shared paper)P. Viktorovitch (1 shared paper)M. Gendry (1 shared paper)A. Bekkaoui (1 shared paper)Y. Monteil (1 shared paper)M. Garrigues (2 shared papers)J.L. Weyher (2 shared papers)
- Journals
- Semiconductor Science and Technology (1 paper)Applied Physics Letters (1 paper)Materials Science and Engineering B (1 paper)
- Partner nations
- France
In The Last Decade
F. Krafft
3 papers receiving 32 citations
Peers
Comparison fields: 5 of 8
- Atomic and Molecular Physics, and Optics 29
- Electrical and Electronic Engineering 31
- Condensed Matter Physics 3
- Materials Chemistry 8
- Surfaces, Coatings and Films 1
Countries citing papers authored by F. Krafft
This map shows the geographic impact of F. Krafft's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Krafft with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Krafft more than expected).
Fields of papers citing papers by F. Krafft
This network shows the impact of papers produced by F. Krafft. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Krafft. The network helps show where F. Krafft may publish in the future.
Co-authors
The 10 scholars most cited alongside F. Krafft, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1991 | 23 | |
| 2 | 1992 | 7 | |
| 3 | 1993 | 3 | |
| 4 | 2005 | 0 |
About F. Krafft
F. Krafft is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Computational Mechanics, Surfaces, Coatings and Films and Industrial and Manufacturing Engineering, having authored 4 papers that have together received 33 indexed citations. Recurring topics across this work include Semiconductor Quantum Structures and Devices (2 papers), Semiconductor materials and interfaces (2 papers), Electron and X-Ray Spectroscopy Techniques (1 paper), Ion-surface interactions and analysis (1 paper), Electrowetting and Microfluidic Technologies (1 paper), Semiconductor materials and devices (1 paper), Industrial Vision Systems and Defect Detection (1 paper) and Photonic and Optical Devices (1 paper). The work is most often cited by research in Atomic and Molecular Physics, and Optics (29 citations), Electrical and Electronic Engineering (31 citations), Condensed Matter Physics (3 citations), Materials Chemistry (8 citations) and Surfaces, Coatings and Films (1 citation). F. Krafft has collaborated with scholars based in France. Frequent co-authors include Stanisław Krawczyk, Pierre Abraham, P. Viktorovitch, M. Gendry, A. Bekkaoui, Y. Monteil, M. Garrigues, J.L. Weyher, C. Frigeri and R. Fornari. Their work appears in journals such as Semiconductor Science and Technology, Applied Physics Letters and Materials Science and Engineering B.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.