E.J. Walker
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Surfaces, Coatings and Films top 10%
- Optical Coatings and Gratings
Papers in
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- Semiconductor materials and devices 6
- Advancements in Semiconductor Devices and Circuit Design 5
- Silicon Carbide Semiconductor Technologies 3
- Integrated Circuits and Semiconductor Failure Analysis 3
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- Target Tracking and Data Fusion in Sensor Networks 2
- Co-authors
- F.H. Gaensslen (3 shared papers)V.L. Rideout (2 shared papers)Andrew R. Neureuther (1 shared paper)F.H. Dill (1 shared paper)Peter W. Cook (3 shared papers)R.H. Dennard (3 shared papers)Xinjia Chen (2 shared papers)
- Journals
- IEEE Transactions on Electron Devices (4 papers)IEEE Journal of Solid-State Circuits (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (2 papers)
- Partner nations
- United States
In The Last Decade
E.J. Walker
7 papers receiving 551 citations
Peers
Comparison fields: 5 of 37
- Electrical and Electronic Engineering 574
- Surfaces, Coatings and Films 65
- Biomedical Engineering 153
- Atomic and Molecular Physics, and Optics 68
- Computer Graphics and Computer-Aided Design 8
Countries citing papers authored by E.J. Walker
This map shows the geographic impact of E.J. Walker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E.J. Walker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E.J. Walker more than expected).
Fields of papers citing papers by E.J. Walker
This network shows the impact of papers produced by E.J. Walker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E.J. Walker. The network helps show where E.J. Walker may publish in the future.
Co-authors
The 7 scholars most cited alongside E.J. Walker, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1977 | 253 | |
| 2 | 1975 | 192 | |
| 3 | 1979 | 73 | |
| 4 | 1975 | 52 | |
| 5 | 1979 | 32 | |
| 6 | 1978 | 8 | |
| 7 | Design and characterization of very small MOSFETs for low temperature operation | 1975 | 7 |
| 8 | 2011 | 0 | |
| 9 | 2011 | 0 |
About E.J. Walker
E.J. Walker is a scholar working on Electrical and Electronic Engineering, Artificial Intelligence, Computer Networks and Communications, Control and Systems Engineering and Computational Mechanics, having authored 9 papers that have together received 617 indexed citations. Recurring topics across this work include Semiconductor materials and devices (6 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Silicon Carbide Semiconductor Technologies (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Target Tracking and Data Fusion in Sensor Networks (2 papers), Advanced Surface Polishing Techniques (1 paper), Copper Interconnects and Reliability (1 paper) and Fault Detection and Control Systems (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (574 citations), Surfaces, Coatings and Films (65 citations), Biomedical Engineering (153 citations), Atomic and Molecular Physics, and Optics (68 citations) and Computer Graphics and Computer-Aided Design (8 citations). E.J. Walker has collaborated with scholars based in United States. Frequent co-authors include F.H. Gaensslen, V.L. Rideout, Andrew R. Neureuther, F.H. Dill, Peter W. Cook, R.H. Dennard and Xinjia Chen. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Journal of Solid-State Circuits and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.