E. J. Scheibner
Impact in
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques
- Structural Biology top 5%
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 7
-
- Magnetic properties of thin films 3
- Quantum, superfluid, helium dynamics 2
- Surface and Thin Film Phenomena 2
- Advanced Chemical Physics Studies 2
- Co-authors
- Mena Atalla (1 shared paper)Eileen Tannenbaum (1 shared paper)C. D. Hartman (2 shared papers)Lester H. Germer (2 shared papers)G. F. Amelio (1 shared paper)Gary W. Simmons (1 shared paper)Yale E. Strausser (1 shared paper)J. S. Johannessen (1 shared paper)
- Journals
- Journal of Applied Physics (5 papers)Surface Science (3 papers)Review of Scientific Instruments (2 papers)Thin Solid Films (1 paper)Bell System Technical Journal (1 paper)
- Partner nations
- United States
In The Last Decade
E. J. Scheibner
18 papers receiving 572 citations
Peers
Comparison fields: 5 of 51
- Surfaces, Coatings and Films 340
- Structural Biology 32
- Radiation 100
- Atomic and Molecular Physics, and Optics 291
- Electrical and Electronic Engineering 381
Countries citing papers authored by E. J. Scheibner
This map shows the geographic impact of E. J. Scheibner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. J. Scheibner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. J. Scheibner more than expected).
Fields of papers citing papers by E. J. Scheibner
This network shows the impact of papers produced by E. J. Scheibner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. J. Scheibner. The network helps show where E. J. Scheibner may publish in the future.
Co-authors
The 9 scholars most cited alongside E. J. Scheibner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1959 | 204 | |
| 2 | 1967 | 107 | |
| 3 | 1967 | 82 | |
| 4 | 1960 | 73 | |
| 5 | 1968 | 66 | |
| 6 | 1960 | 53 | |
| 7 | 1968 | 40 | |
| 8 | 1972 | 30 | |
| 9 | 1978 | 24 | |
| 10 | 1966 | 9 | |
| 11 | 1965 | 8 | |
| 12 | 1961 | 7 | |
| 13 | 1965 | 5 | |
| 14 | THE INTERPRETATION OF ELECTRON DIFFRACTION PATTERNS | 1951 | 5 |
| 15 | 1962 | 4 | |
| 16 | 1967 | 2 | |
| 17 | 1962 | 2 | |
| 18 | 1962 | 2 | |
| 19 | Reliability factors for electronic components in a storage environment | 1977 | 1 |
About E. J. Scheibner
E. J. Scheibner is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Ceramics and Composites, having authored 19 papers that have together received 724 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (7 papers), Semiconductor materials and devices (4 papers), Magnetic properties of thin films (3 papers), Magnetic Properties and Applications (3 papers), Quantum, superfluid, helium dynamics (2 papers), Surface and Thin Film Phenomena (2 papers), Advanced Chemical Physics Studies (2 papers) and Silicon and Solar Cell Technologies (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (340 citations), Structural Biology (32 citations), Radiation (100 citations), Atomic and Molecular Physics, and Optics (291 citations) and Electrical and Electronic Engineering (381 citations). E. J. Scheibner has collaborated with scholars based in United States. Frequent co-authors include Mena Atalla, Eileen Tannenbaum, C. D. Hartman, Lester H. Germer, G. F. Amelio, Gary W. Simmons, Yale E. Strausser, J. S. Johannessen and John A. Copeland. Their work appears in journals such as Journal of Applied Physics, Surface Science, Review of Scientific Instruments, Thin Solid Films and Bell System Technical Journal.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.