E. J. Scheibner

845 citations
19 papers · 625 · h-index 10

Impact in

Papers in

E. J. Scheibner

18 papers receiving 520 citations

Peers

E. J. Scheibner
Comparison fields: 5 of 46
  • Surfaces, Coatings and Films 292
  • Structural Biology 27
  • Radiation 85
  • Atomic and Molecular Physics, and Optics 248
  • Electrical and Electronic Engineering 337
Replace Shozo Kono with:
Shozo Kono Japan
G.M. Guichar France
P. J. Orders United States
Tetsuro Hanawa Japan
W. Czaja Switzerland
Toshihiro Ichikawa Japan
F. Proix France
B. Schmiedeskamp Germany
S. L. Cundy United Kingdom
Tsunenori Sakamoto Poland
E. J. Scheibner relative to Shozo Kono Japan Shozo Kono's profile →
Citations per field
00.5×1.7×
Shozo Kono · 1×
Citations per year

Countries citing papers authored by E. J. Scheibner

Since Specialization
Citations

This map shows the geographic impact of E. J. Scheibner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. J. Scheibner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. J. Scheibner more than expected).

Fields of papers citing papers by E. J. Scheibner

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. J. Scheibner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. J. Scheibner. The network helps show where E. J. Scheibner may publish in the future.

Co-authors

The 9 scholars most cited alongside E. J. Scheibner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with E. J. Scheibner Line = papers co-authored together E. J. Scheibner links everyone, so they are left out of the graph.

All Works

19 of 19 papers shown
#Work
1 1959165
2 196798
3 196773
4 196059
5 196853
6 196045
7 196839
8 197226
9 197823
10 19669
11 19658
12 19616
13 19655
14
THE INTERPRETATION OF ELECTRON DIFFRACTION PATTERNS
19515
15 19624
16 19672
17 19622
18 19622
19
Reliability factors for electronic components in a storage environment
19771

About E. J. Scheibner

E. J. Scheibner is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials and Materials Chemistry, having authored 19 papers that have together received 625 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (7 papers), Semiconductor materials and devices (4 papers), Magnetic Properties and Applications (3 papers), Magnetic properties of thin films (3 papers), Advanced Chemical Physics Studies (2 papers), Surface and Thin Film Phenomena (2 papers), Quantum, superfluid, helium dynamics (2 papers) and Silicon and Solar Cell Technologies (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (292 citations), Structural Biology (27 citations), Radiation (85 citations), Atomic and Molecular Physics, and Optics (248 citations) and Electrical and Electronic Engineering (337 citations). E. J. Scheibner has collaborated with scholars based in United States. Frequent co-authors include Mena Atalla, Eileen Tannenbaum, L. H. Germer, C. D. Hartman, G. F. Amelio, Gary W. Simmons, J. S. Johannessen, Y. E. Strausser and J.A. Copeland. Their work appears in journals such as Journal of Applied Physics, Surface Science, Review of Scientific Instruments, Thin Solid Films and Bell System Technical Journal.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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