David Samper
About
David Samper has authored 33 papers that have received a total of 530 indexed citations.
This includes 25 papers in Mechanical Engineering, 11 papers in Statistics, Probability and Uncertainty and 10 papers in Computer Vision and Pattern Recognition. The topics of these papers are Advanced Measurement and Metrology Techniques (25 papers), Advanced machining processes and optimization (14 papers) and Scientific Measurement and Uncertainty Evaluation (11 papers). David Samper is often cited by papers focused on Advanced Measurement and Metrology Techniques (25 papers), Advanced machining processes and optimization (14 papers) and Scientific Measurement and Uncertainty Evaluation (11 papers) and collaborates with scholars based in Spain and France. David Samper's co-authors include Jorge Santolaria, Juan José Aguilar Martín, Sergio Aguado, C. Sanz and Eduardo Juárez and has published in prestigious journals such as Sensors, International Journal of Machine Tools and Manufacture and The International Journal of Advanced Manufacturing Technology.
In The Last Decade
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