David C. Gray
Impact in
- Mechanics of Materials top 10%
- Metal and Thin Film Mechanics
-
- Plasma Diagnostics and Applications
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
Papers in
-
- Semiconductor materials and devices 7
- Plasma Diagnostics and Applications 7
- Silicon Carbide Semiconductor Technologies 1
-
- Metal and Thin Film Mechanics 3
- Co-authors
- Herbert H. Sawin (8 shared papers)John Arnold (1 shared paper)Michael T. Mocella (1 shared paper)Jeffery W. Butterbaugh (2 shared papers)
- Journals
- Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (3 papers)Journal of The Electrochemical Society (3 papers)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (2 papers)
- Partner nations
- United States
In The Last Decade
David C. Gray
8 papers receiving 335 citations
Peers
Comparison fields: 5 of 26
- Mechanics of Materials 167
- Electrical and Electronic Engineering 319
- Computational Mechanics 67
- Electronic, Optical and Magnetic Materials 39
- Materials Chemistry 89
Countries citing papers authored by David C. Gray
This map shows the geographic impact of David C. Gray's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David C. Gray with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David C. Gray more than expected).
Fields of papers citing papers by David C. Gray
This network shows the impact of papers produced by David C. Gray. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David C. Gray. The network helps show where David C. Gray may publish in the future.
Co-authors
The 4 scholars most cited alongside David C. Gray, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1993 | 221 | |
| 2 | 1994 | 45 | |
| 3 | 1991 | 37 | |
| 4 | 1993 | 32 | |
| 5 | 1990 | 7 | |
| 6 | 1992 | 3 | |
| 7 | 1995 | 3 | |
| 8 | 1995 | 1 |
About David C. Gray
David C. Gray is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Radiology, Nuclear Medicine and Imaging, Applied Mathematics and Surfaces, Coatings and Films, having authored 8 papers that have together received 349 indexed citations. Recurring topics across this work include Semiconductor materials and devices (7 papers), Plasma Diagnostics and Applications (7 papers), Metal and Thin Film Mechanics (3 papers), Silicon Carbide Semiconductor Technologies (1 paper), Optical Coatings and Gratings (1 paper), Silicon Nanostructures and Photoluminescence (1 paper), Gas Dynamics and Kinetic Theory (1 paper) and Advanced Surface Polishing Techniques (1 paper). The work is most often cited by research in Mechanics of Materials (167 citations), Electrical and Electronic Engineering (319 citations), Computational Mechanics (67 citations), Electronic, Optical and Magnetic Materials (39 citations) and Materials Chemistry (89 citations). David C. Gray has collaborated with scholars based in United States. Frequent co-authors include Herbert H. Sawin, John Arnold, Michael T. Mocella and Jeffery W. Butterbaugh. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of The Electrochemical Society and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.