D. S. Alles

521 citations
16 papers · 321 · h-index 7

Impact in

Papers in

    • Advancements in Photolithography Techniques 11
    • Integrated Circuits and Semiconductor Failure Analysis 6
    • Semiconductor Lasers and Optical Devices 2
    • Semiconductor materials and devices 2
    • Particle Accelerators and Free-Electron Lasers 1
    • Electron and X-Ray Spectroscopy Techniques 6

D. S. Alles

15 papers receiving 270 citations

Peers

D. S. Alles
Comparison fields: 5 of 52
  • Human-Computer Interaction 95
  • Cognitive Neuroscience 164
  • Surfaces, Coatings and Films 28
  • Structural Biology 5
  • Experimental and Cognitive Psychology 31
Replace R. Hamilton Shepard with:
R. Hamilton Shepard United States
Yitian Shao United States
Satoshi Saga Japan
Nicholas Wettels United States
Seung‐Woo Lee South Korea
Keisuke Hasegawa Japan
Michal Karol Dobrzynski Switzerland
Hyung-Sik Kim South Korea
Taku Nakamura Japan
J.G. Linvill United States
D. S. Alles relative to R. Hamilton Shepard United States R. Hamilton Shepard's profile →
Citations per field
00.5×1.5×2.2×
R. Hamilton Shepard · 1×
Citations per year

Countries citing papers authored by D. S. Alles

Since Specialization
Citations

This map shows the geographic impact of D. S. Alles's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. S. Alles with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. S. Alles more than expected).

Fields of papers citing papers by D. S. Alles

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. S. Alles. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. S. Alles. The network helps show where D. S. Alles may publish in the future.

Co-authors

The 21 scholars most cited alongside D. S. Alles, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D. S. Alles Line = papers co-authored together D. S. Alles links everyone, so they are left out of the graph.

All Works

16 of 16 papers shown
#Work
1 1970180
2 197568
3 200220
4 198312
5 19759
6 19876
7 20036
8 19895
9 19704
10 19743
11 20042
12 20102
13 20052
14
A second generation Ebes
19751
15 19871
16 20000

About D. S. Alles

D. S. Alles is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Mechanical Engineering, Industrial and Manufacturing Engineering and Cognitive Neuroscience, having authored 16 papers that have together received 321 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (11 papers), Electron and X-Ray Spectroscopy Techniques (6 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Industrial Vision Systems and Defect Detection (2 papers), Semiconductor Lasers and Optical Devices (2 papers), Semiconductor materials and devices (2 papers), Interactive and Immersive Displays (1 paper) and Particle Accelerators and Free-Electron Lasers (1 paper). The work is most often cited by research in Human-Computer Interaction (95 citations), Cognitive Neuroscience (164 citations), Surfaces, Coatings and Films (28 citations), Structural Biology (5 citations) and Experimental and Cognitive Psychology (31 citations). D. S. Alles has collaborated with scholars based in United States and Japan. Frequent co-authors include D. R. Herriott, R.J. Collier, John W. Stafford, M.P. Lepselter, H. J. Levinstein, A. M. Johnson, George Smith, Chris A. Mack, J. G. Skinner and M. G. R. Thomson. Their work appears in journals such as IEEE Transactions on Electron Devices, Proceedings of the IEEE, Bell System Technical Journal, Journal of Vacuum Science and Technology and Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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