C.D. Schaper
Impact in
- Control and Systems Engineering top 10%
- Advanced Control Systems Optimization
- Iterative Learning Control Systems
- Fault Detection and Control Systems
- Control Systems and Identification
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- Industrial Vision Systems and Defect Detection
Papers in
-
- Advancements in Photolithography Techniques 8
- Silicon and Solar Cell Technologies 7
- 3D IC and TSV technologies 6
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- Control Systems and Identification 6
- Iterative Learning Control Systems 4
- Co-authors
- T. Kailath (14 shared papers)Weng Khuen Ho (4 shared papers)Arthur E. Tay (5 shared papers)Duncan A. Mellichamp (3 shared papers)Dale E. Seborg (3 shared papers)Wallace E. Larimore (2 shared papers)Yong Jin Lee (3 shared papers)Stephen Boyd (2 shared papers)
- Journals
- IEEE Transactions on Semiconductor Manufacturing (9 papers)IEEE Transactions on Control Systems Technology (2 papers)Applied Physics A (2 papers)Computers & Chemical Engineering (1 paper)Nanotechnology (1 paper)
- Partner nations
- United StatesSingapore
In The Last Decade
C.D. Schaper
27 papers receiving 354 citations
Peers
Comparison fields: 5 of 52
- Control and Systems Engineering 150
- Industrial and Manufacturing Engineering 43
- Electrical and Electronic Engineering 203
- Statistics, Probability and Uncertainty 23
- Acoustics and Ultrasonics 2
Countries citing papers authored by C.D. Schaper
This map shows the geographic impact of C.D. Schaper's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.D. Schaper with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.D. Schaper more than expected).
Fields of papers citing papers by C.D. Schaper
This network shows the impact of papers produced by C.D. Schaper. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.D. Schaper. The network helps show where C.D. Schaper may publish in the future.
Co-authors
The 25 scholars most cited alongside C.D. Schaper, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 30 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1994 | 44 | |
| 2 | 1999 | 35 | |
| 3 | 2002 | 33 | |
| 4 | 1994 | 28 | |
| 5 | 2000 | 27 | |
| 6 | 2003 | 23 | |
| 7 | 1991 | 22 | |
| 8 | 1992 | 21 | |
| 9 | 2004 | 17 | |
| 10 | 1994 | 17 | |
| 11 | 2002 | 16 | |
| 12 | 1999 | 15 | |
| 13 | 2013 | 12 | |
| 14 | 1991 | 10 | |
| 15 | 1991 | 10 | |
| 16 | 2004 | 8 | |
| 17 | 2004 | 8 | |
| 18 | 2004 | 8 | |
| 19 | 1990 | 6 | |
| 20 | 1996 | 4 |
About C.D. Schaper
C.D. Schaper is a scholar working on Electrical and Electronic Engineering, Control and Systems Engineering, Industrial and Manufacturing Engineering, Biomedical Engineering and Computer Networks and Communications, having authored 30 papers that have together received 380 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (8 papers), Silicon and Solar Cell Technologies (7 papers), 3D IC and TSV technologies (6 papers), Control Systems and Identification (6 papers), Nanofabrication and Lithography Techniques (5 papers), Iterative Learning Control Systems (4 papers), Advanced Surface Polishing Techniques (4 papers) and Industrial Vision Systems and Defect Detection (4 papers). The work is most often cited by research in Control and Systems Engineering (150 citations), Industrial and Manufacturing Engineering (43 citations), Electrical and Electronic Engineering (203 citations), Statistics, Probability and Uncertainty (23 citations) and Acoustics and Ultrasonics (2 citations). C.D. Schaper has collaborated with scholars based in United States and Singapore. Frequent co-authors include T. Kailath, Weng Khuen Ho, Arthur E. Tay, Duncan A. Mellichamp, Dale E. Seborg, Wallace E. Larimore, Yong Jin Lee, Stephen Boyd, Masoud Moslehi and Stephen A. Norman. Their work appears in journals such as IEEE Transactions on Semiconductor Manufacturing, IEEE Transactions on Control Systems Technology, Applied Physics A, Computers & Chemical Engineering and Nanotechnology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.