Bor-Yiing Su
About
Bor-Yiing Su has authored 7 papers that have received a total of 403 indexed citations.
This includes 5 papers in Hardware and Architecture, 4 papers in Electrical and Electronic Engineering and 2 papers in Artificial Intelligence. The topics of these papers are VLSI and FPGA Design Techniques (4 papers), VLSI and Analog Circuit Testing (4 papers) and Copper Interconnects and Reliability (2 papers). Bor-Yiing Su is often cited by papers focused on VLSI and FPGA Design Techniques (4 papers), VLSI and Analog Circuit Testing (4 papers) and Copper Interconnects and Reliability (2 papers) and collaborates with scholars based in Taiwan, United States and China. Bor-Yiing Su's co-authors include Yao‐Wen Chang, Hassan Chafi, David A. Patterson, Jiang Hu and Bryan Catanzaro and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Micro.
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