National Institute of Measurement and Testing Technology

372 papers and 3.3k indexed citations

About

In recent decades, authors affiliated with National Institute of Measurement and Testing Technology have published 372 papers, which have received a total of 3.3k indexed citations. Scholars at this organization have produced 98 papers in Electrical and Electronic Engineering, 68 papers in Mechanical Engineering and 57 papers in Biomedical Engineering on the topics of Quantum and electron transport phenomena (21 papers), Gas Sensing Nanomaterials and Sensors (14 papers) and Advanced Measurement and Metrology Techniques (13 papers). Their work is cited by papers focused on Electrical and Electronic Engineering (759 citations), Materials Chemistry (599 citations) and Mechanical Engineering (581 citations). Authors at National Institute of Measurement and Testing Technology collaborate with scholars in China, United States and Taiwan and have published in prestigious journals including Advanced Materials, SHILAP Revista de lepidopterología and ACS Nano. Some of National Institute of Measurement and Testing Technology's most productive authors include Yong Yao, Gui Gui, Suixian Yang, Yi Pan, Sen Zhang, Ming Tang, Huchang Liao, Daxiang Li, Xiaochun Wan and Long Zhou.

In The Last Decade

National Institute of Measurement and Testing Technology

309 papers receiving 3.3k citations

Fields of papers published by authors at National Institute of Measurement and Testing Technology

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers affiliated with National Institute of Measurement and Testing Technology at the time of their publication. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers affiliated with National Institute of Measurement and Testing Technology at the time of their publication.

Countries citing scholars working at National Institute of Measurement and Testing Technology

Since Specialization
Citations

This map shows the geographic impact of research produced by authors working at National Institute of Measurement and Testing Technology. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers produced at National Institute of Measurement and Testing Technology with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites National Institute of Measurement and Testing Technology more than expected).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar’s output or impact.

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2026