National Metrology Institute of South Africa

226 papers and 2.4k indexed citations i.

About

In recent decades, authors affiliated with National Metrology Institute of South Africa have published 226 papers, which have received a total of 2.4k indexed citations. Scholars at this organization have produced 60 papers in Statistics, Probability and Uncertainty, 54 papers in Electrical and Electronic Engineering and 39 papers in Biomedical Engineering on the topics of Scientific Measurement and Uncertainty Evaluation (60 papers), Radioactive Decay and Measurement Techniques (32 papers) and Quantum Information and Cryptography (19 papers). Their work is cited by papers focused on Electrical and Electronic Engineering (654 citations), Materials Chemistry (503 citations) and Biomedical Engineering (487 citations). Authors at National Metrology Institute of South Africa collaborate with scholars in South Africa, Germany and United States and have published in prestigious journals including Nature Communications, Environmental Science & Technology and Journal of Applied Physics. Some of National Metrology Institute of South Africa's most productive authors include Filippus S. Roux, Jayne de Vos, H.C. Swart, David E. Motaung, Laura Quinn, James Tshilongo, Martin Brits, J. de Boer, Egmont R. Rohwer and Zamaswazi P. Tshabalala.

In The Last Decade

Fields of papers published by authors at National Metrology Institute of South Africa

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers affiliated with National Metrology Institute of South Africa at the time of their publication. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers affiliated with National Metrology Institute of South Africa at the time of their publication.

Countries citing scholars working at National Metrology Institute of South Africa

Since Specialization
Citations

This map shows the geographic impact of research produced by authors working at National Metrology Institute of South Africa. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers produced at National Metrology Institute of South Africa with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites National Metrology Institute of South Africa more than expected).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar’s output or impact.

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