National Institute of Metrology
Impact in
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- Scientific Measurement and Uncertainty Evaluation
- Analytical Chemistry top 10%
- Analytical chemistry methods development
Papers in
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- Scientific Measurement and Uncertainty Evaluation 416
- Radiation 230
- Top scholars
- Kenneth C. MillsHongmei LiXianjiang LiXiang FangQinghe ZhangWen MaXinhua DaiJingbo Chao
- Journals
- Metrologia (207 papers)IEEE Transactions on Instrumentation and Measurement (141 papers)Analytical and Bioanalytical Chemistry (65 papers)Measurement (62 papers)Analytical Chemistry (52 papers)
- Partner nations
- ChinaUnited StatesGermany
In The Last Decade
National Institute of Metrology
3.4k papers receiving 40.2k citations
Peers
Comparison fields: 5 of 219
- Statistics, Probability and Uncertainty 2.4k
- Analytical Chemistry 2.5k
- Spectroscopy 4.2k
- Biomedical Engineering 8.0k
- Electronic, Optical and Magnetic Materials 3.3k
Countries citing scholars working at National Institute of Metrology
This map shows the geographic impact of research produced by authors working at National Institute of Metrology. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers produced at National Institute of Metrology with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites National Institute of Metrology more than expected).
Fields of papers published by authors at National Institute of Metrology
This network shows the impact of papers affiliated with National Institute of Metrology at the time of their publication. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers affiliated with National Institute of Metrology at the time of their publication.
About National Institute of Metrology
In recent decades, authors affiliated with National Institute of Metrology have published 3.9k papers, which have received a total of 41.3k indexed citations . Scholars at this organization have produced 417 papers in Statistics, Probability and Uncertainty, 230 papers in Radiation, 401 papers in Spectroscopy, 492 papers in Aerospace Engineering and 1.1k papers in Electrical and Electronic Engineering on the topics of Scientific Measurement and Uncertainty Evaluation (416 papers), Advanced Electrical Measurement Techniques (284 papers), Calibration and Measurement Techniques (240 papers), Sensor Technology and Measurement Systems (230 papers), Mass Spectrometry Techniques and Applications (207 papers), Advanced Sensor Technologies Research (199 papers), Advanced Frequency and Time Standards (176 papers) and Advanced Measurement and Metrology Techniques (157 papers). Their work is cited by papers focused on Statistics, Probability and Uncertainty (2.4k citations), Analytical Chemistry (2.5k citations), Spectroscopy (4.2k citations), Biomedical Engineering (8.0k citations) and Electronic, Optical and Magnetic Materials (3.3k citations). Authors at National Institute of Metrology collaborate with scholars in China, United States and Germany and have published in prestigious journals including Metrologia, IEEE Transactions on Instrumentation and Measurement, Analytical and Bioanalytical Chemistry, Measurement and Analytical Chemistry. Some of National Institute of Metrology's most productive authors include Kenneth C. Mills, Hongmei Li, Xianjiang Li, Xiang Fang, Qinghe Zhang, Wen Ma, Xinhua Dai, Jingbo Chao, Huwei Liu and Xiaoping Dai.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.