Beam Engineering for Advanced Measurements (United States)

5.7k citations
297 papers ·

Impact in

Papers in

Beam Engineering for Advanced Measurements (United States)

280 papers receiving 5.7k citations

Peers

Beam Engineering for Advanced Measurements (United States)
Comparison fields: 5 of 142
  • Electronic, Optical and Magnetic Materials 3.2k
  • Atomic and Molecular Physics, and Optics 2.1k
  • Surfaces, Coatings and Films 350
  • Mechanical Engineering 1.3k
  • Media Technology 285
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Citations per field
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Citations per year

Countries citing scholars working at Beam Engineering for Advanced Measurements (United States)

Since Specialization
Citations

This map shows the geographic impact of research produced by authors working at Beam Engineering for Advanced Measurements (United States). It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers produced at Beam Engineering for Advanced Measurements (United States) with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Beam Engineering for Advanced Measurements (United States) more than expected).

Fields of papers published by authors at Beam Engineering for Advanced Measurements (United States)

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers affiliated with Beam Engineering for Advanced Measurements (United States) at the time of their publication. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers affiliated with Beam Engineering for Advanced Measurements (United States) at the time of their publication.

About Beam Engineering for Advanced Measurements (United States)

In recent decades, authors affiliated with Beam Engineering for Advanced Measurements (United States) have published 297 papers, which have received a total of 5.7k indexed citations . Scholars at this organization have produced 158 papers in Electronic, Optical and Magnetic Materials, 142 papers in Atomic and Molecular Physics, and Optics, 27 papers in Surfaces, Coatings and Films, 111 papers in Electrical and Electronic Engineering and 66 papers in Biomedical Engineering on the topics of Liquid Crystal Research Advancements (141 papers), Photonic Crystals and Applications (60 papers), Photonic and Optical Devices (47 papers), Photorefractive and Nonlinear Optics (34 papers), Photochromic and Fluorescence Chemistry (23 papers), Optical Coatings and Gratings (19 papers), Gyrotron and Vacuum Electronics Research (19 papers) and Nonlinear Optical Materials Studies (19 papers). Their work is cited by papers focused on Electronic, Optical and Magnetic Materials (3.2k citations), Atomic and Molecular Physics, and Optics (2.1k citations), Surfaces, Coatings and Films (350 citations), Mechanical Engineering (1.3k citations) and Media Technology (285 citations). Authors at Beam Engineering for Advanced Measurements (United States) collaborate with scholars in United States, Italy and Armenia and have published in prestigious journals including Optics Express, Journal of the Optical Society of America B, Applied Physics Letters, Optics Letters and IEEE Transactions on Electron Devices. Some of Beam Engineering for Advanced Measurements (United States)'s most productive authors include Nelson V. Tabiryan, Timothy J. Bunning, Svetlana V. Serak, Timothy J. White, Uladzimir A. Hrozhyk, Luciano De Sio, Brian R. Kimball, Diane M. Steeves, Richard A. Vaia and Sarik R. Nersisyan.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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