W. Cote

5 papers and 111 indexed citations i.

W. Cote is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Biomedical Engineering. According to data from OpenAlex, W. Cote has authored 5 papers receiving a total of 111 indexed citations (citations by other indexed papers that have themselves been cited), including 5 papers in Electrical and Electronic Engineering, 2 papers in Electronic, Optical and Magnetic Materials and 1 paper in Biomedical Engineering. Recurrent topics in W. Cote’s work include Semiconductor materials and devices (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Copper Interconnects and Reliability (2 papers). W. Cote is often cited by papers focused on Semiconductor materials and devices (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Copper Interconnects and Reliability (2 papers). W. Cote collaborates with scholars based in United States and Switzerland. W. Cote's co-authors include W.H. Henkels, Greg Yeric, Charles W. Koburger, Michael Hall and Barry Mitchell and has published in prestigious journals such as Thin Solid Films, IEEE Journal of Solid-State Circuits and IBM Journal of Research and Development.