Jonathan Campbell
About
Jonathan Campbell has authored 12 papers that have received a total of 167 indexed citations.
This includes 5 papers in Artificial Intelligence, 5 papers in Computer Vision and Pattern Recognition and 3 papers in Industrial and Manufacturing Engineering. The topics of these papers are Industrial Vision Systems and Defect Detection (3 papers), Neural Networks and Applications (3 papers) and Optical measurement and interference techniques (2 papers). Jonathan Campbell is often cited by papers focused on Industrial Vision Systems and Defect Detection (3 papers), Neural Networks and Applications (3 papers) and Optical measurement and interference techniques (2 papers) and collaborates with scholars based in United Kingdom, Canada and France. Jonathan Campbell's co-authors include Fionn Murtagh, Chris Fraley, Adrian E. Raftery, Clark Verbrugge and Bernard O’Connor and has published in prestigious journals such as Neurocomputing, Pattern Recognition Letters and Optical Engineering.
In The Last Decade
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