Erwine Pargon

1.4k citations
100 papers · 1.1k · h-index 18

Impact in

Papers in

Erwine Pargon

97 papers receiving 1.1k citations

Peers

Erwine Pargon
Comparison fields: 5 of 42
  • Electrical and Electronic Engineering 955
  • Surfaces, Coatings and Films 84
  • Atomic and Molecular Physics, and Optics 312
  • Electronic, Optical and Magnetic Materials 120
  • Mechanics of Materials 145
Replace Camille Petit-Etienne with:
Camille Petit-Etienne France
C. Gourgon France
Pascal Besson France
Daniel Guidotti United States
Christophe D. Mihalcea Japan
Theodorus E. Standaert United States
Domenico Tulli Spain
Kwang Hong Lee Singapore
Y. J. Mii United States
Erwine Pargon relative to Camille Petit-Etienne France Camille Petit-Etienne's profile →
Citations per field
00.5×1.5×2×2.3×
Camille Petit-Etienne · 1×
Citations per year

Countries citing papers authored by Erwine Pargon

Since Specialization
Citations

This map shows the geographic impact of Erwine Pargon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Erwine Pargon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Erwine Pargon more than expected).

Fields of papers citing papers by Erwine Pargon

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Erwine Pargon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Erwine Pargon. The network helps show where Erwine Pargon may publish in the future.

Co-authors

The 25 scholars most cited alongside Erwine Pargon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Erwine Pargon Line = papers co-authored together Erwine Pargon links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 100 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201995
2 200965
3 200348
4 201246
5 202345
6 201343
7 201843
8 200941
9 200840
10 201230
11 201128
12 200527
13 200324
14 202024
15 202323
16 201921
17 201119
18 201118
19 201917
20 202116

About Erwine Pargon

Erwine Pargon is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Condensed Matter Physics and Electronic, Optical and Magnetic Materials, having authored 100 papers that have together received 1.1k indexed citations. Recurring topics across this work include Semiconductor materials and devices (43 papers), Advancements in Photolithography Techniques (27 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers), Photonic and Optical Devices (21 papers), Plasma Diagnostics and Applications (15 papers), Advanced Fiber Laser Technologies (12 papers), Advanced Surface Polishing Techniques (11 papers) and Metal and Thin Film Mechanics (11 papers). The work is most often cited by research in Electrical and Electronic Engineering (955 citations), Surfaces, Coatings and Films (84 citations), Atomic and Molecular Physics, and Optics (312 citations), Electronic, Optical and Magnetic Materials (120 citations) and Mechanics of Materials (145 citations). Erwine Pargon has collaborated with scholars based in France, Canada and United States. Frequent co-authors include Olivier Rolland Joubert, Camille Petit-Etienne, Marc Fouchier, K. Menguelti, Corrado Sciancalepore, Mickael Martin, Laurène Youssef, Thorsten B. Lill, L. Vallier and J. Foucher. Their work appears in journals such as Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Materials Science in Semiconductor Processing and Microelectronic Engineering.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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